Mao Nannan, Lin Yuxuan, Bie Ya-Qing, Palacios Tomás, Liang Liangbo, Saito Riichiro, Ling Xi, Kong Jing, Tisdale William A
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States.
Department of Chemical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, United States.
Nano Lett. 2021 Jun 9;21(11):4809-4815. doi: 10.1021/acs.nanolett.1c00917. Epub 2021 May 28.
The strength of interlayer coupling critically affects the physical properties of 2D materials such as black phosphorus (BP), where the electronic structure depends sensitively on layer thickness. Rigid-layer vibrations reflect directly the interlayer coupling strength in 2D van der Waals solids, but measurement of these characteristic frequencies is made difficult by sample instability and small Raman scattering cross sections in atomically thin elemental crystals. Here, we overcome these challenges in BP by performing resonance-enhanced low-frequency Raman scattering under an argon-protective environment. Interlayer breathing modes for atomically thin BP were previously unobservable under conventional (nonresonant) excitation but became strongly enhanced when the excitation energy matched the sub-band electronic transitions of few-layer BP, down to bilayer thicknesses. The measured out-of-plane interlayer force constant was found to be 10.1 × 10 N/m in BP, which is comparable to graphene. Accurate characterization of the interlayer coupling strength lays the foundation for future exploration of BP twisted structures and heterostructures.
层间耦合强度对二维材料(如黑磷,BP)的物理性质有着至关重要的影响,其中电子结构对层厚非常敏感。刚性层振动直接反映了二维范德华固体中的层间耦合强度,但由于样品不稳定性以及原子级薄的元素晶体中拉曼散射截面较小,使得测量这些特征频率变得困难。在此,我们通过在氩气保护环境下进行共振增强低频拉曼散射,克服了BP中的这些挑战。原子级薄的BP的层间呼吸模式在传统(非共振)激发下以前无法观测到,但当激发能量与少层BP直至双层厚度的子带电子跃迁相匹配时,该模式会强烈增强。在BP中测得的面外层面力常数为10.1×10 N/m,与石墨烯相当。准确表征层间耦合强度为未来探索BP扭曲结构和异质结构奠定了基础。