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基于冷冻电镜图谱的模型验证:采用错误发现率方法

Cryo-EM Map-Based Model Validation Using the False Discovery Rate Approach.

作者信息

Olek Mateusz, Joseph Agnel Praveen

机构信息

Department of Chemistry, University of York, York, United Kingdom.

Electron BioImaging Center, Rutherford Appleton Laboratory, Didcot, United Kingdom.

出版信息

Front Mol Biosci. 2021 May 18;8:652530. doi: 10.3389/fmolb.2021.652530. eCollection 2021.

Abstract

Significant technological developments and increasing scientific interest in cryogenic electron microscopy (cryo-EM) has resulted in a rapid increase in the amount of data generated by these experiments and the derived atomic models. Robust measures for the validation of 3D reconstructions and atomic models are essential for appropriate interpretation of the data. The resolution of data and availability of software tools that work across a range of resolutions often limit the quality of derived models. Hence, the final atomic model is often incomplete or contains regions where atomic positions are less reliable or incorrectly built. Extensive manual pruning and local adjustments or rebuilding are usually required to address these issues. The presented research introduces a software tool for the validation of the backbone trace of atomic models built in the cryo-EM density maps. In this study, we use the false discovery rate analysis, which can be used to segregate molecular signals from the background. Each atomic position in the model can be associated with an FDR backbone validation score, which can be used to identify potential mistraced residues. We demonstrate that the proposed validation score is complementary to existing validation metrics and is useful especially in cases where the model is built in the maps having varying local resolution. We also discuss the application of the score for automated pruning of atomic models built during the iterative model building process in Buccaneer. We have implemented this score in the CCP-EM software suite.

摘要

低温电子显微镜技术(cryo-EM)取得了重大技术进展,并且科学界对其兴趣日增,这使得这些实验所产生的数据以及由此得到的原子模型数量迅速增加。对三维重建和原子模型进行验证的可靠措施对于正确解读数据至关重要。数据分辨率以及适用于一系列分辨率的软件工具的可用性常常限制了所推导模型的质量。因此,最终的原子模型往往不完整,或者包含一些原子位置可靠性较低或构建错误的区域。通常需要进行大量的手动修剪以及局部调整或重建来解决这些问题。本研究介绍了一种用于验证在低温电子显微镜密度图中构建的原子模型主链轨迹的软件工具。在本研究中,我们使用错误发现率分析,该分析可用于从背景中分离分子信号。模型中的每个原子位置都可以关联一个错误发现率主链验证分数,该分数可用于识别潜在的主链追踪错误的残基。我们证明所提出的验证分数是对现有验证指标的补充,尤其在模型是在具有不同局部分辨率的图谱中构建的情况下很有用。我们还讨论了该分数在自动修剪海盗软件(Buccaneer)迭代模型构建过程中所构建的原子模型方面的应用。我们已将此分数实现在CCP-EM软件套件中。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/a228/8167059/bb7e75be77e0/fmolb-08-652530-g001.jpg

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