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场致依赖脱水与氰化物膜的最佳离子逃逸路径

Field-Dependent Dehydration and Optimal Ionic Escape Paths for CN Membranes.

作者信息

Barabash Miraslau L, Gibby William A T, Guardiani Carlo, Luchinsky Dmitry G, Luan Binquan, Smolyanitsky Alex, McClintock Peter V E

机构信息

Department of Physics, Lancaster University, Lancaster LA1 4YB, United Kingdom.

Department of Mechanical and Aerospace Engineering, Sapienza University, 00184 Rome, Italy.

出版信息

J Phys Chem B. 2021 Jul 1;125(25):7044-7059. doi: 10.1021/acs.jpcb.1c03255. Epub 2021 Jun 11.

Abstract

Most analytic theories describing electrostatically driven ion transport through water-filled nanopores assume that the corresponding permeation barriers are bias-independent. While this assumption may hold for sufficiently wide pores under infinitely small bias, transport through subnanometer pores under finite bias is difficult to interpret analytically. Given recent advances in subnanometer pore fabrication and the rapid progress in detailed computer simulations, it is important to identify and understand the specific field-induced phenomena arising during ion transport. Here we consider an atomistic model of electrostatically driven ion permeation through subnanoporous CN membranes. We analyze probability distributions of ionic escape trajectories and show that the optimal escape path switches between two different configurations depending on the bias magnitude. We identify two distinct mechanisms contributing to field-induced changes in transport-opposing barriers: a weak one arising from field-induced ion dehydration and a strong one due to the field-induced asymmetry of the hydration shells. The simulated current-voltage characteristics are compared with the solution of the 1D Nernst-Planck model. Finally, we show that the deviation of simulated currents from analytic estimates for large fields is consistent with the field-induced barriers and the observed changes in the optimal ion escape path.

摘要

大多数描述静电驱动离子通过充满水的纳米孔传输的分析理论都假定相应的渗透势垒与偏压无关。虽然在无限小的偏压下,对于足够宽的孔,这一假设可能成立,但在有限偏压下,通过亚纳米孔的传输很难进行解析解释。鉴于亚纳米孔制造方面的最新进展以及详细计算机模拟的快速发展,识别和理解离子传输过程中出现的特定场致现象非常重要。在此,我们考虑静电驱动离子透过亚纳米多孔CN膜的原子模型。我们分析了离子逃逸轨迹的概率分布,并表明最优逃逸路径会根据偏压大小在两种不同构型之间切换。我们确定了导致场致传输阻碍变化的两种不同机制:一种较弱的机制源于场致离子脱水,另一种较强的机制是由于水化壳层的场致不对称性。将模拟的电流 - 电压特性与一维能斯特 - 普朗克模型的解进行了比较。最后,我们表明,在大场情况下模拟电流与解析估计值的偏差与场致势垒以及观察到的最优离子逃逸路径的变化是一致的。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/212b/8279548/1b6126cb7f4f/jp1c03255_0001.jpg

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