Heggemann Jonas, Laflör Linda, Rahe Philipp
Fachbereich Physik, Universität Osnabrück, Barbarastrasse 7, 49076 Osnabrück, Germany.
Rev Sci Instrum. 2021 May 1;92(5):053705. doi: 10.1063/5.0041172.
A double sample holder supporting both a metal sample and an insulator crystal for high-resolution scanning probe microscopy experiments is described. The metal sample serves as a substrate for tip preparation and tip functionalization to efficiently and reliably enable high-resolution studies of the adjacent insulator surface. Imaging of Ag(111)/mica, Au(111)/mica, CaF(111), and calcite(104) surfaces is demonstrated at 5 K, including images on calcite(104) produced with a CO terminated tip, which was prepared on the adjacent metal sample.
描述了一种用于高分辨率扫描探针显微镜实验的双样品架，其可同时支撑金属样品和绝缘体晶体。金属样品用作制备针尖和对针尖进行功能化处理的基底，以高效、可靠地实现对相邻绝缘体表面的高分辨率研究。展示了在5 K下对Ag(111)/云母、Au(111)/云母、CaF(111)和方解石(104)表面的成像，包括使用在相邻金属样品上制备的CO端接针尖对方解石(104)表面所生成的图像。
