Stoupin S, Thorn D B, Ose N, Gao L, Hill K W, Ping Y, Coppari F, Kozioziemski B, Krygier A, Sio H, Ayers J, Bitter M, Kraus B, Efthimion P C, Schneider M B
Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA.
Rev Sci Instrum. 2021 May 1;92(5):053102. doi: 10.1063/5.0043685.
We report the development of a high-resolution spectrometer for extended x-ray absorption fine structure (EXAFS) studies of materials under extreme conditions. A curved crystal and detector in the spectrometer are replaceable such that a single body is employed to perform EXAFS measurements at different x-ray energy intervals of interest. Two configurations have been implemented using toroidal crystals with Ge 311 reflection set to provide EXAFS at the Cu K-edge (energy range 8.9-9.8 keV) and Ge 400 reflection set to provide EXAFS at the Ta L3-edge (9.8-10.7 keV). Key performance characteristics of the spectrometer were found to be consistent with design parameters. The data generated at the National Ignition Facility have shown an ≃3 eV spectral resolution for the Cu K-edge configuration and ≃6 eV for the Ta L3-edge configuration.
我们报告了一种用于在极端条件下对材料进行扩展X射线吸收精细结构（EXAFS）研究的高分辨率光谱仪的研制情况。光谱仪中的弯曲晶体和探测器是可替换的，这样就可以用一个主体在感兴趣的不同X射线能量区间进行EXAFS测量。已经采用了两种配置，使用设置为在Cu K边（能量范围8.9 - 9.8 keV）提供EXAFS的Ge 311反射的环形晶体，以及设置为在Ta L3边（9.8 - 10.7 keV）提供EXAFS的Ge 400反射的环形晶体。发现该光谱仪的关键性能特征与设计参数一致。在国家点火装置产生的数据显示，Cu K边配置的光谱分辨率约为3 eV，Ta L3边配置的光谱分辨率约为6 eV。
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