Yin Wen-Jin, Liu Yu, Wen Bo, Li Xi-Bo, Chai Yi-Feng, Wei Xiao-Lin, Ma Shangyi, Teobaldi Gilberto
School of Physics and Electronic Science, Hunan University of Science and Technology, Xiangtan 411201, China and Key Laboratory of Intelligent Sensor and Advance Materials of Hunan Province, Hunan University of Science and Technology, Xiangtan 411201, China.
School of Physics and Electronics, Henan University, Kaifeng 475001, P. R. China.
Dalton Trans. 2021 Jul 27;50(29):10252-10260. doi: 10.1039/d1dt01121a.
Charge-carrier mobility is a determining factor of the transport properties of semiconductor materials and is strongly related to the optoelectronic performance of nanoscale devices. Here, we investigate the electronic properties and charge carrier mobility of monolayer Janus MoSSe nanoribbons by means of first-principles simulations coupled with deformation potential theory. These simulations indicate that zigzag nanoribbons are metallic. Conversely, armchair nanoribbons are semiconducting and show oscillations in the calculated band gap as a function of edge-width according to the 3p < 3p + 1 < 3p + 2 rule, with p being the integer number of repeat units along the non-periodic direction of the nanoribbon. Although the charge-carrier mobility of armchair nanoribbons oscillates with the edge-width, its magnitude is comparable to its two-dimensional sheet counterpart. A robust room-temperature carrier mobility is calculated for 3.5 nm armchair nanoribbons with values ranging from 50 cm2 V-1 s-1 to 250 cm2 V-1 s-1 for electrons (e) and holes (h), respectively. A comparison of these values with the results for periodic flat sheet (e: 73.8 cm2 V-1 s-1; h: 157.2 cm2 V-1 s-1) reveals enhanced (suppressed) hole (electron) mobility in the Janus MoSSe nanoribbons. This is in contrast to what was previously found for MoS2 nanoribbons, namely larger mobility for electrons in comparison with holes. These differences are rationalized on the basis of the different structures, edge electronic states and deformation potentials present in the MoSSe nanoribbons. The present results provide the guidelines for the structural and electronic engineering of MoSSe nanoribbon edges towards tailored electron transport properties.
电荷载流子迁移率是半导体材料传输特性的一个决定性因素,并且与纳米级器件的光电性能密切相关。在此,我们通过结合形变势理论的第一性原理模拟,研究了单层Janus MoSSe纳米带的电子性质和电荷载流子迁移率。这些模拟表明,锯齿形纳米带是金属性的。相反,扶手椅形纳米带是半导体性的,并且根据3p < 3p + 1 < 3p + 2规则,计算得到的带隙随边缘宽度呈现振荡,其中p是沿纳米带非周期性方向的重复单元的整数。尽管扶手椅形纳米带的电荷载流子迁移率随边缘宽度振荡,但其大小与二维薄片相当。对于3.5 nm的扶手椅形纳米带,计算得到了稳健的室温载流子迁移率,电子(e)和空穴(h)的值分别在50 cm2 V-1 s-1至250 cm2 V-1 s-1范围内。将这些值与周期性平板的结果(e:73.8 cm2 V-1 s-1;h:157.2 cm2 V-1 s-1)进行比较,发现Janus MoSSe纳米带中空穴(电子)迁移率增强(抑制)。这与之前在MoS2纳米带中发现的情况相反,即电子迁移率比空穴大。基于MoSSe纳米带中存在的不同结构、边缘电子态和形变势,对这些差异进行了合理的解释。目前的结果为MoSSe纳米带边缘的结构和电子工程提供了指导,以实现定制的电子传输特性。