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三相光栅X射线干涉测量中的样品相位梯度和条纹相移。

Sample phase gradient and fringe phase shift in triple phase grating X-ray interferometry.

作者信息

Yan Aimin, Wu Xizeng, Liu Hong

机构信息

Department of Radiology, University of Alabama at Birmingham, Birmingham, AL 35249, USA.

Center for Bioengineering and School of Electrical and Computer Engineering, University of Oklahoma, Norman, OK 73019, USA.

出版信息

OSA Contin. 2020 Oct 15;3(10):2782-2796. doi: 10.1364/osac.405190. Epub 2020 Sep 27.

Abstract

Triple phase grating X-ray interferometry is a promising new technique of grating based X-ray differential phase contrast imaging. Accurate retrieval of sample phase gradients from measured interference fringe shifts is a key task in X-ray interferometry. To fulfill this task in triple phase grating X-ray interferometry with monochromatic X-ray sources, the authors derived exact formulas relating sample phase gradient to fringe phase shift. These formulas not only provide a design optimization tool for triple phase grating interferometry, but also lay a foundation for quantitative phase contrast imaging.

摘要

三相光栅X射线干涉测量法是一种基于光栅的X射线微分相衬成像的新兴且有前景的技术。从测量得到的干涉条纹位移中准确恢复样品的相位梯度是X射线干涉测量中的一项关键任务。为了在使用单色X射线源的三相光栅X射线干涉测量中完成这项任务,作者推导出了将样品相位梯度与条纹相移相关联的精确公式。这些公式不仅为三相光栅干涉测量提供了一种设计优化工具,也为定量相衬成像奠定了基础。

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Performance and optimization of X-ray grating interferometry.X 射线光栅干涉仪的性能与优化。
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