通过X射线光电子能谱探测Au/ZrS(001)界面的复杂性。

Complexities at the Au/ZrS(001) interface probed by x-ray photoemission spectroscopy.

作者信息

Dhingra Archit, Lipatov Alexey, Sinitskii Alexander, Dowben Peter A

机构信息

Department of Physics and Astronomy, University of Nebraska-Lincoln, Jorgenson Hall, 855 North 16th Street, Lincoln, NE 68588-0299, United States of America.

Department of Chemistry, University of Nebraska-Lincoln, Hamilton Hall, 639 North 12th Street, Lincoln, NE 68588-0304, United States of America.

出版信息

J Phys Condens Matter. 2021 Aug 12;33(43). doi: 10.1088/1361-648X/ac16f8.

DOI:10.1088/1361-648X/ac16f8

PMID:34293733

Abstract

Interaction between the Au adlayers and ZrS(001) has been examined via x-ray photoemission spectroscopy (XPS). The angle-resolved XPS measurements reveal that ZrS(001) is disulfide (S) terminated and the Au thickness-dependent XPS indicates that the observed band bending, for low Au coverage, is consistent with formation of a Schottky barrier at the Au/ZrS(001) interface. This band bending, however, appears to be suppressed as the thickness of Au adlayer is increased, indicating varying interfacial interactions at the Au/ZrS(001) interface. Such complex interface effects between Au and ZrS(001) may explain the observed non-ohmic-characteristics for a ZrS-based device, and could suppress current injection.

摘要

通过X射线光电子能谱（XPS）研究了金吸附层与ZrS(001)之间的相互作用。角分辨XPS测量表明ZrS(001)以二硫化物（S）终止，且金厚度依赖的XPS表明，对于低金覆盖率，观察到的能带弯曲与在Au/ZrS(001)界面形成肖特基势垒一致。然而，随着金吸附层厚度的增加，这种能带弯曲似乎受到抑制，这表明Au/ZrS(001)界面处的界面相互作用在变化。金与ZrS(001)之间这种复杂的界面效应可能解释了基于ZrS的器件中观察到的非欧姆特性，并可能抑制电流注入。