Jin Ting, Gao Shangce, Xia Hongxuan, Ding Hui
School of Science, Nanjing Forestry University, Nanjing, 210037 Jiangsu, China.
Faculty of Engineering, University of Toyama, Toyama-shi 930-8555, Japan.
J Adv Res. 2021 Apr 27;32:15-26. doi: 10.1016/j.jare.2021.04.008. eCollection 2021 Sep.
According to the competing failure theorem, the fractional-order Resistor Capacitance (RC) circuit system suffers not only from internal degradation but also from external shocks. However, due to the general differences of each failure type in the data availability and cognitive uncertainty, a better model is needed to describe the degradation process within the system. Also, a new reliability analysis method is needed for the circuit system under internal degradation and external shocks.
To demonstrate this problem, this paper proposes a novel class of Caputo-type uncertain random fractional-order model that focuses on the reliability analysis of a fractional-order RC circuit system.
First, an uncertain Liu process is used to describe the internal degradation of soft faults and a stochastic process is used to describe the external random shocks of hard faults. Secondly, taking into account the correlation and competition among the fault types, an extreme shock model and a cumulative shock model are constructed, and chance theory is introduced to further explore the fault mechanisms, from which the corresponding reliability indices are derived. Finally, the predictor-corrector method is applied and numerical examples are given.
This paper presents a reliability analysis of a fractional-order RC circuit system with internal failure obeying an uncertain process and external failure obeying a stochastic process, and gives the calculation of the reliability indexes for different cases and the corresponding numerical simulations.
A new competing failure model for a fractional-order RC circuit system is presented and analyzed for reliability, which is proved to be of practical importance by numerical simulations.
根据竞争失效定理，分数阶电阻电容（RC）电路系统不仅会遭受内部退化，还会受到外部冲击。然而，由于每种失效类型在数据可用性和认知不确定性方面存在普遍差异，需要一个更好的模型来描述系统内的退化过程。此外，对于处于内部退化和外部冲击下的电路系统，还需要一种新的可靠性分析方法。
为了说明这个问题，本文提出了一类新型的Caputo型不确定随机分数阶模型，该模型专注于分数阶RC电路系统的可靠性分析。
首先，使用不确定的刘过程来描述软故障的内部退化，并使用随机过程来描述硬故障的外部随机冲击。其次，考虑故障类型之间的相关性和竞争性，构建了极端冲击模型和累积冲击模型，并引入机会理论进一步探究故障机制，从中推导出相应的可靠性指标。最后，应用预测校正方法并给出数值算例。
本文对内部故障服从不确定过程且外部故障服从随机过程的分数阶RC电路系统进行了可靠性分析，并给出了不同情况下可靠性指标的计算以及相应的数值模拟。
提出并分析了一种用于分数阶RC电路系统的新的竞争失效模型的可靠性，数值模拟证明该模型具有实际意义。
