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用辉光放电质谱法测定碳纳米管中的金属杂质

Determination of Metallic Impurities in Carbon Nanotubes by Glow Discharge Mass Spectrometry.

作者信息

Grinberg Patricia, Methven Bradley A J, Swider Katarzyna, Mester Zoltan

机构信息

Metrology, National Research Council Canada, Ottawa, Ontario K1A 0R6, Canada.

出版信息

ACS Omega. 2021 Aug 25;6(35):22717-22725. doi: 10.1021/acsomega.1c03013. eCollection 2021 Sep 7.

DOI:10.1021/acsomega.1c03013
PMID:34514243
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC8427626/
Abstract

A method for the rapid assessment of metallic impurities in carbon nanotubes (CNTs) by pin-cell source geometry glow discharge mass spectrometry (GDMS) is presented. Pins were prepared by pressing CNT powder onto an indium substrate. GDMS analysis was performed using high-carbon-content nanotube and coal-certified reference materials for calibration purposes. This approach enables the calibrated measurement of 41 elemental impurities in CNTs. The method was validated by the analysis of NIST SRM 2483 single-wall CNTs (raw soot) with good agreement with the certified values. The proposed measurement approach could also be applied not only for CNTs but also for the assessment of precursor materials used in the synthesis of CNTs and for quality control during the entire manufacturing process. The ability to assess the presence of all metallic impurities in a simple, reliable, high-throughput manner will allow the industry to real-time monitor any changes in the product process, access its toxicity, and environmental impact. As sample preparation is maintained to a minimum, this allows the determination of metallic impurities at concentration levels that are usually not attainable by most techniques.

摘要

本文介绍了一种通过针式源几何结构辉光放电质谱法(GDMS)快速评估碳纳米管(CNT)中金属杂质的方法。通过将碳纳米管粉末压在铟基板上来制备针状物。为了校准目的,使用高碳含量的纳米管和煤炭认证参考材料进行GDMS分析。这种方法能够对碳纳米管中的41种元素杂质进行校准测量。通过对NIST SRM 2483单壁碳纳米管(原始烟灰)的分析验证了该方法,其结果与认证值吻合良好。所提出的测量方法不仅可应用于碳纳米管,还可用于评估碳纳米管合成中使用的前驱体材料以及整个制造过程中的质量控制。以简单、可靠、高通量的方式评估所有金属杂质的存在,将使该行业能够实时监测产品过程中的任何变化,了解其毒性和环境影响。由于样品制备保持在最低限度,这使得能够测定大多数技术通常无法达到的浓度水平的金属杂质。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/57a5/8427626/fa926f540592/ao1c03013_0003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/57a5/8427626/bc5fa2e8d444/ao1c03013_0002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/57a5/8427626/fa926f540592/ao1c03013_0003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/57a5/8427626/bc5fa2e8d444/ao1c03013_0002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/57a5/8427626/fa926f540592/ao1c03013_0003.jpg

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Elemental characterization of single-wall carbon nanotube certified reference material by neutron and prompt γ activation analysis.
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