Matsuda Hiroaki, Suzuki Yoriyasu
Department of Cardiology Nagoya Heart Center Nagoya Japan.
Health Sci Rep. 2021 Sep 8;4(3):e365. doi: 10.1002/hsr2.365. eCollection 2021 Sep.
We aim at examining the long-term clinical outcome after Xience everolimus-eluting stent (X-EES) implantation.
Long-term clinical outcomes beyond 5 years after X-EES implantation remain unclear.
This retrospective study has collected data from 1184 consecutive patients, corresponding to 1463 lesions, who were treated with X-EES alone in the Nagoya Heart Center between January 2010 and December 2013. The primary endpoint was the 10-year cumulative incidence of target lesion failure (TLF), defined as cardiac death, target vessel myocardial infarction (MI), and clinically indicated target lesion revascularization (TLR). Definite/probable stent thrombosis (ST) was evaluated as a secondary outcome.
At 10 years, the cumulative incidence of TLF was recorded to be 12.4%, whereas that of cardiac death, target vessel MI, and clinically indicated TLR was at 4.4%, 4.1%, and 7.8%, respectively. The cumulative rate of definite/probable ST was observed to remain low (0.3% at 30 days; 0.3% at 1 year; 0.6% at 5 years; and 1.1% at 10 years). In the multivariate analysis, the risk factors of TLF were insulin-treated diabetes (hazard ratio (HR), 1.93; 95% confidence interval (CI), 1.13-3.29; = .02), left ventricular dysfunction (HR, 2.28; 95% CI, 1.43-3.62; < .01), hemodialysis (HR, 2.22; 95% CI, 1.39-3.56; < .01), prior percutaneous coronary intervention (HR, 1.68; 95% CI, 1.18-2.41; < .01), peripheral vascular disease (HR, 1.70; 95% CI, 1.07-2.69; < .01), severe calcification (HR, 2.08; 95% CI, 1.36-3.09; < .01), and in-stent restenosis (HR, 2.93; 95% CI, 1.64-4.89; < .01).
The incidence rates of the long-term adverse effects after X-EES implantation, such as late TLR and ST, were determined to be low in this study; however, they increased over time until 10 years after stent implantation.
我们旨在研究雅培依维莫司洗脱支架(X-EES)植入后的长期临床结局。
X-EES植入5年后的长期临床结局仍不明确。
这项回顾性研究收集了2010年1月至2013年12月期间在名古屋心脏中心接受单纯X-EES治疗的1184例连续患者(对应1463处病变)的数据。主要终点是靶病变失败(TLF)的10年累积发生率,定义为心源性死亡、靶血管心肌梗死(MI)和临床指征的靶病变血运重建(TLR)。明确/可能的支架血栓形成(ST)被评估为次要结局。
10年时,TLF的累积发生率为12.4%,而心源性死亡、靶血管MI和临床指征的TLR的累积发生率分别为4.4%、4.1%和7.8%。明确/可能的ST的累积发生率一直较低(30天时为0.3%;1年时为0.3%;5年时为0.6%;10年时为1.1%)。在多变量分析中,TLF的危险因素包括胰岛素治疗的糖尿病(风险比[HR],1.93;95%置信区间[CI],1.13 - 3.29;P = 0.02)、左心室功能障碍(HR,2.28;95% CI,1.43 - 3.62;P < 0.01)、血液透析(HR,2.22;95% CI,1.39 - 3.56;P < 0.01)、既往经皮冠状动脉介入治疗(HR,1.68;95% CI,1.18 - 2.41;P < 0.01)、外周血管疾病(HR,1.70;95% CI,1.07 - 2.69;P < 0.01)、严重钙化(HR,2.08;95% CI,1.36 - 3.09;P < 0.01)和支架内再狭窄(HR,2.93;95% CI,1.64 - 4.89;P < 0.01)。
本研究确定X-EES植入后的长期不良反应发生率,如晚期TLR和ST较低;然而,这些不良反应发生率在支架植入后直至10年期间随时间增加。