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Correlation symmetry analysis of electron nanodiffraction from amorphous materials.

作者信息

Huang Shuoyuan, Francis Carter, Ketkaew Jittisa, Schroers Jan, Voyles Paul M

机构信息

Department of Materials Science and Engineering, University of Wisconsin Madison, Madison, WI 53706, USA.

Mechanical Engineering, Yale University, New Haven, Connecticut, 06511, USA.

出版信息

Ultramicroscopy. 2022 Jan;232:113405. doi: 10.1016/j.ultramic.2021.113405. Epub 2021 Oct 9.

DOI:10.1016/j.ultramic.2021.113405
PMID:34673441
Abstract

Angular symmetry in diffraction reflects rotational symmetry in the sample. We introduce the angular symmetry coefficient as a method to extract local symmetry information from electron nanodiffraction patterns of amorphous materials. Symmetry coefficients are the average of the angular autocorrelation function at the characteristic angles of a particular rotational symmetry. The symmetry coefficients avoid non-structural features arising from Fourier transformation and Friedel symmetry breakdown that affect the angular power spectrum approach to determining angular symmetries in amorphous nanodiffraction. Both methods require thin samples to avoid overlapping diffraction from clusters of atoms separated in the thickness of the sample, but symmetry coefficients are more forgiving. Electron nanodiffraction experiments on a Pd-based metallic glass sample demonstrate both potentially misleading information in angular power spectrum and the utility of symmetry coefficients.

摘要

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