Gu Dazhen, Jargon Jeffrey A, Ryan Matthew J, Hubrechsen Anouk
RF Technology Division, National Institute of Standards and Technology, Boulder, CO 80305 USA.
RF Technology Division, National Institute of Standards and Technology, Boulder, CO 80305 USA; Department of Aerospace Engineering Sciences, University of Colorado, Boulder, CO 80309 USA.
IEEE Trans Microw Theory Tech. 2020;68(11):4925-4939. doi: 10.1109/tmtt.2020.3014627.
We present a general model of noisy scattering-parameter (S-parameter) measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise is examined to appear like a complex Gaussian quotient. The statistical analysis of the residual error is given, and relevant statistical quantities are derived and discussed. Experiments were conducted on a two-port VNA to validate the noise-influenced S-parameter model. We show that the uncertainty due to the noise is often critical in S-parameter measurements, in particular for S-parameters of a small magnitude.
我们提出了一种由矢量网络分析仪（VNA）执行的噪声散射参数（S 参数）测量的通用模型。研究了由于噪声导致的 S 参数的残余误差，发现其表现为复高斯商。给出了残余误差的统计分析，并推导和讨论了相关统计量。在一个两端口 VNA 上进行了实验，以验证受噪声影响的 S 参数模型。我们表明，在 S 参数测量中，尤其是对于小幅度的 S 参数，由噪声引起的不确定性通常至关重要。
