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基于超窄瑞利异常的具有超高品质因数的镜背介质超表面传感器。

Mirror-backed dielectric metasurface sensor with ultrahigh figure of merit based on a super-narrow Rayleigh anomaly.

作者信息

Wang Yonghang, Xiong Lei, Tian Ming, Li Guangyuan

出版信息

Appl Opt. 2021 Dec 20;60(36):11205-11210. doi: 10.1364/AO.445054.

Abstract

Plasmonic nanostructures with large local field enhancement have been extensively investigated for sensing applications. However, the quality factor and thus the sensing figure of merit are limited due to relatively high ohmic loss. Here we propose a novel, to the best of our knowledge, plasmonic sensor with an ultrahigh figure of merit based on a super-narrow Rayleigh anomaly (RA) in a mirror-backed dielectric metasurface. Simulation results show that the RA in such a metasurface can have a super-high quality factor of 16,000 in the visible regime, which is an order of magnitude larger than the highest value of reported plasmonic nanostructures. We attribute this striking performance to the enhanced electric fields far away from the metal film. The super-high quality factor and the greatly enhanced field confined to the superstrate region make the mirror-backed dielectric metasurface an ideal platform for sensing. We show that the figure of merit of this RA-based metasurface sensor can be as high as 15,930/refractive index units. Additionally, we reveal that RA-based plasmonic sensors share some typical characteristics, providing guidance for the structure design. We expect this work to advance the development of high-performance plasmonic metasurface sensors.

摘要

具有大的局部场增强的等离子体纳米结构已被广泛研究用于传感应用。然而,由于相对较高的欧姆损耗,品质因数以及因此的传感品质因数受到限制。在此,据我们所知,我们提出了一种基于背镜介电超表面中的超窄瑞利异常(RA)的具有超高品质因数的新型等离子体传感器。仿真结果表明,这种超表面中的RA在可见光范围内可以具有16000的超高品质因数,这比报道的等离子体纳米结构的最高值大一个数量级。我们将这种显著的性能归因于远离金属膜的增强电场。超高品质因数以及局限于上层区域的大大增强的场使得背镜介电超表面成为理想的传感平台。我们表明,这种基于RA的超表面传感器的品质因数可以高达15930/折射率单位。此外,我们揭示了基于RA的等离子体传感器具有一些典型特征,为结构设计提供了指导。我们期望这项工作推动高性能等离子体超表面传感器的发展。

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