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基于材料参数优化改善氧基电化学随机存取存储器突触特性的策略

Strategies to Improve the Synaptic Characteristics of Oxygen-Based Electrochemical Random-Access Memory Based on Material Parameters Optimization.

作者信息

Lee Jongwon, Nikam Revannath Dnyandeo, Kwak Myonghoon, Hwang Hyunsang

机构信息

Center for Single-Atom-based Semiconductor Devices and Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Korea.

出版信息

ACS Appl Mater Interfaces. 2022 Mar 23;14(11):13450-13457. doi: 10.1021/acsami.1c21045. Epub 2022 Mar 8.

Abstract

Oxygen-based electrochemical random-access memories (O-ECRAMs) are promising synaptic devices for neuromorphic applications because of their near-ideal synaptic characteristics and compatibility with complementary metal-oxide-semiconductor processes. However, the correlation between material parameters and synaptic properties of O-ECRAM devices has not yet been elucidated. Here, we propose the critical design parameters to fabricate an ideal ECRAM device. Based on the experimental data and simulation results, it is revealed that consistent ion supply from the electrolyte and rapid ion diffusion in the channel are critical factors for ideal synaptic characteristics. To optimize these parameters, crystalline WO exhibiting fast ion diffusivity and ZrO exhibiting an appropriate ion conduction energy barrier (1.1 eV) are used as a channel and an electrolyte, respectively. As a result, synaptic characteristics with near-ideal weight-update linearity in the nanosiemens conductance range are achieved. Finally, a selector-less O-ECRAM device is integrated into a 2 × 2 array, and high recognition accuracy (94.83%) of the Modified National Institute of Standards and Technology pattern is evaluated.

摘要

基于氧的电化学随机存取存储器(O-ECRAM)因其接近理想的突触特性以及与互补金属氧化物半导体工艺的兼容性,而成为用于神经形态应用的有前途的突触器件。然而,O-ECRAM器件的材料参数与突触特性之间的相关性尚未阐明。在此,我们提出了制造理想ECRAM器件的关键设计参数。基于实验数据和模拟结果表明,来自电解质的持续离子供应以及通道中的快速离子扩散是实现理想突触特性的关键因素。为了优化这些参数,分别使用具有快速离子扩散率的晶体WO和具有适当离子传导能垒(1.1 eV)的ZrO作为通道和电解质。结果,在纳西门子电导范围内实现了具有接近理想权重更新线性度的突触特性。最后,将无选择器的O-ECRAM器件集成到2×2阵列中,并评估了对修改后的美国国家标准与技术研究院图案的高识别准确率(94.83%)。

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