Arose Christopher, Terracciano Anthony C, Peale Robert E, Vasu Subith S
Opt Lett. 2022 Mar 15;47(6):1514-1516. doi: 10.1364/OL.449308.
Polarization- and incident-angle-independent narrow-band terahertz (THz) absorbers were developed to enable THz imaging, radar, and spectroscopy applications. The design comprises a transparent fused silica (SiOx) substrate backed by an optically thick metal layer and topped by a periodic array of metal cross patterns. Finite element analysis (FEA) simulations optimized the geometry of devices fabricated by contact photolithography. Resonances were characterized by Fourier-transform reflectance spectroscopy. The design tunable absorption bands appeared in the range 50-200 cm (1.5-6 THz) with full widths at half maximum of 20-56 cm (0.6-1.68 THz). Maximum absorption was -8.5 to -16.8 dB. The absorption bands are independent of incidence angle and polarization in agreement with simulation.
为实现太赫兹（THz）成像、雷达和光谱应用，开发了偏振和入射角无关的窄带太赫兹吸收器。该设计包括一个透明的熔融石英（SiOₓ）衬底，其背面是一个光学厚度较大的金属层，顶部是一个金属交叉图案的周期性阵列。有限元分析（FEA）模拟优化了通过接触光刻制造的器件的几何形状。通过傅里叶变换反射光谱对共振进行了表征。设计的可调吸收带出现在50 - 200厘米⁻¹（1.5 - 6太赫兹）范围内，半高宽为20 - 56厘米⁻¹（0.6 - 1.68太赫兹）。最大吸收为-8.5至-16.8分贝。吸收带与模拟结果一致，与入射角和偏振无关。
