Nuclear Professional School, School of Engineering, The University of Tokyo, 2-22 Shirakata-shirane, Tokai-mura, Naka-gun, Ibaraki 319-1188, Japan.
Department of Nuclear Engineering and Management, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan.
Radiat Res. 2022 Jun 1;197(6):594-604. doi: 10.1667/RADE-21-00057.1.
In this study, an improved method using scavenger-free plasmid DNA was established to accurately determine yields of DNA damage induced by direct and indirect actions of ionizing radiation. The scavenger-free plasmid DNA was obtained by dialysis over 5-7 days, and the DNA solvent was replaced with phosphate buffer to completely remove impurities, which could be scavengers of radicals produced as a result of water radiolysis. DNA samples of films and dilute aqueous solutions were used to separately evaluate contributions of the direct and indirect actions of X rays (150-160 kVp). The irradiated DNA was analyzed by agarose gel electrophoresis to quantify strand-break yields. The yields of single-strand breaks (SSBs), n(SSB), were determined to be (6.5 ± 2.0) × 10-10 and (3.1 ± 0.9) × 10-7 SSBs/Gy/Da for the film and solution samples, respectively, showing a significant contribution of hydroxyl radicals (•OH) compared with direct energy depositions from ionizing radiation to DNA. As observed in SSBs, the yields of double-strand breaks (DSBs), n(DSB), were (5.6 ± 1.1) × 10-11 and (1.3 ± 0.2) × 10-8 DSBs/Gy/Da for the film and solution samples, respectively. The yield ratio of DSBs to SSBs, that is, n(DSB)/n(SSB), was 0.091 ± 0.026 for the film samples, while it was much lower for the solution samples (0.045 ± 0.010), indicating that direct actions result in more localized strand breaks relative to indirect actions. Base excision repair enzymes, namely, endonuclease III (Nth) and formamidopyrimidine-DNA glycosylase (Fpg), were utilized after irradiations to convert base lesions and apurinic/apyrimidinic (AP) sites into strand breaks. The amounts of Nth and Fpg for the conversion were optimized to a few units per µg of DNA, although the optimal concentrations can differ among conditions.
在这项研究中,建立了一种改良的方法,使用无清除剂的质粒 DNA 来准确测定电离辐射的直接和间接作用诱导的 DNA 损伤的产量。无清除剂的质粒 DNA 通过 5-7 天的透析获得,并将 DNA 溶剂替换为磷酸盐缓冲液,以完全去除由水辐射分解产生的自由基的清除剂。使用薄膜和稀水溶液的 DNA 样品分别评估 X 射线(150-160 kVp)的直接和间接作用的贡献。通过琼脂糖凝胶电泳分析辐照 DNA 以定量链断裂产量。薄膜和溶液样品的单链断裂(SSB)产率 n(SSB)分别为(6.5 ± 2.0)×10-10 和(3.1 ± 0.9)×10-7 SSB/Gy/Da,表明与电离辐射直接能量沉积相比,羟基自由基(•OH)对 DNA 的贡献显著。与 SSB 一样,双链断裂(DSB)产率 n(DSB)分别为薄膜和溶液样品的(5.6 ± 1.1)×10-11 和(1.3 ± 0.2)×10-8 DSB/Gy/Da。DSB 与 SSB 的产率比,即 n(DSB)/n(SSB),薄膜样品为 0.091 ± 0.026,而溶液样品则低得多(0.045 ± 0.010),表明直接作用导致相对于间接作用更多的局部链断裂。碱基切除修复酶,即内切核酸酶 III(Nth)和 8-氧鸟嘌呤-DNA 糖基化酶(Fpg),在辐照后用于将碱基损伤和无嘌呤/无嘧啶(AP)位点转化为链断裂。Nth 和 Fpg 的转化量优化为每 µg DNA 几个单位,尽管最佳浓度可能因条件而异。