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基于深硅刻蚀的全硅长波长红外消色差超表面透镜设计

Design of the all-silicon long-wavelength infrared achromatic metalens based on deep silicon etching.

作者信息

Shan Dongzhi, Xu Nianxi, Gao Jinsong, Song Naitao, Liu Hai, Tang Yang, Feng Xiaoguo, Wang Yansong, Zhao Yi, Chen Xin, Sun Qiao

出版信息

Opt Express. 2022 Apr 11;30(8):13616-13629. doi: 10.1364/OE.449870.

Abstract

An all-silicon long-wavelength infrared (LWIR) achromatic metalens based on deep silicon etching is designed in this paper. With a fixed aperture size, the value range of the equivalent optical thickness of the non-dispersive meta-atoms constructing the achromatic metalens determines the minimum f-number. The fabrication characteristic with high aspect ratio of deep silicon etching amplifies the difference value of optical thickness between different meta-atoms by increasing the propagation distance of the propagation mode, which ensures a small f-number to obtain a better imaging resolution. A 280-µm-diameter silicon achromatic metalens with a f-number of 1 and the average focusing efficiency of 27.66% has been designed and simulated to validate the feasibility of this strategy. The simulation results show that the maximum focal length deviation percentage from the target value between the wavelength of 8.6 and 11.4 µm is 1.61%. This achromatic metalens design is expected to play a role in the field of LWIR integrated optical system.

摘要

本文设计了一种基于深硅刻蚀的全硅长波长红外(LWIR)消色差超透镜。在固定孔径尺寸下,构成消色差超透镜的非色散超原子的等效光学厚度值范围决定了最小f数。深硅刻蚀的高纵横比制造特性通过增加传播模式的传播距离来放大不同超原子之间的光学厚度差值,从而确保小f数以获得更好的成像分辨率。设计并模拟了一个直径为280 µm、f数为1且平均聚焦效率为27.66%的硅消色差超透镜,以验证该策略的可行性。模拟结果表明,在8.6至11.4 µm波长范围内,与目标值的最大焦距偏差百分比为1.61%。这种消色差超透镜设计有望在LWIR集成光学系统领域发挥作用。

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