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富士胶片BAS-TR成像板对高达40 MeV的激光驱动质子响应的绝对校准。

Absolute calibration of Fujifilm BAS-TR image plate response to laser driven protons up to 40 MeV.

作者信息

Martin P, Ahmed H, Doria D, Alejo A, Clarke R, Ferguson S, Fernández-Tobias J, Freeman R R, Fuchs J, Green A, Green J S, Gwynne D, Hanton F, Jarrett J, Jung D, Kakolee K F, Krygier A G, Lewis C L S, McIlvenny A, McKenna P, Morrison J T, Najmudin Z, Naughton K, Nersisyan G, Norreys P, Notley M, Roth M, Ruiz J A, Scullion C, Zepf M, Zhai S, Borghesi M, Kar S

机构信息

Centre for Plasma Physics, School of Mathematics and Physics, Queen's University Belfast, Belfast, BT7 1NN, United Kingdom.

Central Laser Facility, Rutherford Appleton Laboratory, Didcot, Oxfordshire OX11 0QX, United Kingdom.

出版信息

Rev Sci Instrum. 2022 May 1;93(5):053303. doi: 10.1063/5.0089402.

DOI:10.1063/5.0089402
PMID:35649771
Abstract

Image plates (IPs) are a popular detector in the field of laser driven ion acceleration, owing to their high dynamic range and reusability. An absolute calibration of these detectors to laser-driven protons in the routinely produced tens of MeV energy range is, therefore, essential. In this paper, the response of Fujifilm BAS-TR IPs to 1-40 MeV protons is calibrated by employing the detectors in high resolution Thomson parabola spectrometers in conjunction with a CR-39 nuclear track detector to determine absolute proton numbers. While CR-39 was placed in front of the image plate for lower energy protons, it was placed behind the image plate for energies above 10 MeV using suitable metal filters sandwiched between the image plate and CR-39 to select specific energies. The measured response agrees well with previously reported calibrations as well as standard models of IP response, providing, for the first time, an absolute calibration over a large range of proton energies of relevance to current experiments.

摘要

成像板(IPs)因其高动态范围和可重复使用性,在激光驱动离子加速领域是一种常用的探测器。因此,对这些探测器在常规产生的几十兆电子伏特能量范围内的激光驱动质子进行绝对校准至关重要。在本文中,富士胶片BAS-TR成像板对1-40兆电子伏质子的响应通过在高分辨率汤姆逊抛物线光谱仪中使用该探测器,并结合CR-39核径迹探测器来确定绝对质子数进行校准。对于较低能量的质子,CR-39放置在成像板前方,而对于能量高于10兆电子伏的情况,使用夹在成像板和CR-39之间的合适金属滤光片将其放置在成像板后方以选择特定能量。测量得到的响应与先前报道的校准以及成像板响应的标准模型吻合良好,首次在与当前实验相关的大范围质子能量上提供了绝对校准。

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Rev Sci Instrum. 2022 May 1;93(5):053303. doi: 10.1063/5.0089402.
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