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副束不均匀性对采用分离板探测器的高离化束诊断法测量等离子体电势的影响。

Affect of Secondary Beam Non-Uniformity on Plasma Potential Measurements by HIBD with Split-Plate Detector.

作者信息

Nedzelskiy Igor, Malaquias Artur, Henriques Rafael, Sharma Ridhima

机构信息

Instituto de Plasma e Fusão Nuclear, Instituto Superior Técnico, Universidade de Lisboa, Av. Rovisco Pais, 1049-001 Lisboa, Portugal.

Culham Science Centre, Abingdon OX14 3DB, UK.

出版信息

Sensors (Basel). 2022 Jul 8;22(14):5135. doi: 10.3390/s22145135.

DOI:10.3390/s22145135
PMID:35890815
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC9317691/
Abstract

In a Heavy Ion Beam Diagnostic (HIBD), the plasma potential is obtained by measuring the energy of the secondary ions resulting from beam-plasma collisions by an electrostatic energy analyzer with split-plate detector (SPD), which relates the secondary ion beam energy variation to its position determined by the difference in currents between the split plates. Conventionally, the data from SPD are analyzed with the assumption that the secondary beam current is uniform. However, the secondary beam presents an effective projection of the primary beam, the current of which, as a rule, has a bell-like non-uniform profile. This paper presents: (i) the general features of the secondary beam profile formation, considered in the simplistic approximation of the circular primary beam and the secondary ions that emerge orthogonal to the primary beam axis, (ii) details of spit-plate detection and the influence of the secondary beam non-uniformity on plasma potential measurements, (iii) supported experimental data from the tokamak ISTTOK HIBD for primary and secondary beam profiles and the SPD transfer characteristic, obtained for the 90° cylindrical energy analyzer (90° CEA) and (iv) the implementation of a multiple cell array detector (MCAD) with dedicated resolution for the measurements of secondary beam profile and MCAD operation in multi-split-plate detection mode for direct measurements of the SPD transfer characteristic.

摘要

在重离子束诊断（HIBD）中，通过使用带有分板探测器（SPD）的静电能量分析仪测量束 - 等离子体碰撞产生的二次离子的能量来获取等离子体电位，该分析仪将二次离子束能量变化与其由分板之间的电流差确定的位置相关联。传统上，在假设二次束电流均匀的情况下分析来自SPD的数据。然而，二次束呈现出初级束的有效投影，初级束的电流通常具有钟形的非均匀分布。本文介绍了：（i）在圆形初级束和与初级束轴正交出现的二次离子的简单近似中考虑的二次束轮廓形成的一般特征，（ii）分板检测的细节以及二次束不均匀性对等离子体电位测量的影响，（iii）来自托卡马克ISTTOK HIBD的关于初级和次级束轮廓以及SPD传输特性的支持性实验数据，该数据是针对90°圆柱形能量分析仪（90°CEA）获得的，以及（iv）具有专用分辨率的多单元阵列探测器（MCAD）的实现，用于测量二次束轮廓以及MCAD在多分裂板检测模式下的操作，以直接测量SPD传输特性。

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