Guo Zhongmin, Zhang Zhisheng, Yan Ruiyang, Feng Shuanglong
College of Materials Science and Engineering, Chongqing University of Technology, Chongqing 400054, People's Republic of China.
Micro-Nano Manufacturing and System Integration Center, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 400714, People's Republic of China.
Nanotechnology. 2022 Sep 8;33(48). doi: 10.1088/1361-6528/ac8b17.
Lead telluride nanowires deposited by electrochemical atomic layers have broad application prospects in the field of photodetectors. In this work, using the method of electrochemical atomic layer deposition, we obtained different morphologies of lead telluride materials by controlling the deposition parameters, such as deposition time, temperature, and potential, and characterized them using SEM, TEM, XPS, and other techniques. A lead telluride nanowire detector with good performance was prepared. The photoresponsivity of the detector is 102 mA W, the detectivity is 2.1 × 10Jones, and the response time and recovery time are 0.52 s and 0.54 s respectively at 2.7m wavelength laser irradiation.