Bunch P C, Huff K E, Van Metter R
J Opt Soc Am A. 1987 May;4(5):902-9. doi: 10.1364/josaa.4.000902.
Detective quantum efficiency provides a useful measure of the imaging efficiency of imaging systems. Methods for measuring the exposure and the spatial-frequency dependence of the contrast transfer function, the noise power spectrum, and the detective quantum efficiency are developed for x-ray imaging systems. These are applied to a high-resolution screen-film combination exposed to a 30-kV-peak x-ray spectrum. The major component sources of screen-film noise in this system are identified and quantified. These are interpreted in terms of a simple model to predict the screen-film noise power spectrum and detective quantum efficiency. Reasonable agreement is found between model predictions and experimental measurements.
探测量子效率为成像系统的成像效率提供了一种有用的衡量方法。针对X射线成像系统，开发了测量对比度传递函数、噪声功率谱以及探测量子效率的曝光和空间频率依赖性的方法。这些方法应用于暴露在30 kV峰值X射线谱下的高分辨率增感屏-胶片组合。确定并量化了该系统中增感屏-胶片噪声的主要成分来源。根据一个简单模型对这些进行了解释，以预测增感屏-胶片噪声功率谱和探测量子效率。发现模型预测结果与实验测量结果之间具有合理的一致性。
