Morelhão Sérgio L, Kycia Stefan W
Institute of Physics, University of São Paulo, São Paulo, SP, Brazil.
Department of Physics, University of Guelph, Guelph, ON, Canada.
Acta Crystallogr A Found Adv. 2022 Sep 1;78(Pt 5):459-462. doi: 10.1107/S2053273322007215. Epub 2022 Aug 5.
X-ray scattering and diffraction phenomena are widely used as analytical tools in nanoscience. Size discrepancies between the two phenomena are commonly observed in crystalline nanoparticle systems. The root of the problem is that each phenomenon is affected by size distribution differently, causing contrasting shifts between the two methods. Once understood, the previously discrepant results lead to a simple formula for obtaining the nanoparticle size distribution.
X射线散射和衍射现象在纳米科学中被广泛用作分析工具。在晶体纳米颗粒系统中，通常会观察到这两种现象之间的尺寸差异。问题的根源在于，每种现象受尺寸分布的影响不同，导致两种方法之间出现相反的偏移。一旦理解了这一点，先前不一致的结果就会得出一个用于获得纳米颗粒尺寸分布的简单公式。
