Zhang Yu, Lau Daniel L
IEEE Trans Pattern Anal Mach Intell. 2024 Jun;46(6):4001-4017. doi: 10.1109/TPAMI.2022.3206265. Epub 2024 May 7.
Structured light illumination is an active 3D scanning technique based on projecting and capturing a set of striped patterns and measuring the warping of the patterns as they reflect off a target object's surface. As designed, each pixel in the camera sees exactly one pixel from the projector; however, there are multi-path situations where a camera pixel sees light from multiple projector positions. In the case of bimodal multi-path, the camera pixel receives light from exactly two positions, which occurs along a step edge where the edge slices through a pixel which, therefore, sees both a foreground and background surface. In this paper, we present a general mathematical model to address this bimodal multi-path issue in a phase-shifting or so-called phase-measuring-profilometry scanner to measure the constructive and destructive interference between the two light paths, and by taking advantage of this interference, separate the paths and make two decoupled depth measurements. We validate our algorithm with both simulations and a number of challenging real-world scenarios, significantly outperforming the state-of-the-art methods.
结构光照明是一种主动式3D扫描技术，其基于投射和捕获一组条纹图案，并测量图案在从目标物体表面反射时的变形。按照设计，相机中的每个像素恰好看到投影仪中的一个像素；然而，存在多路径情况，即相机像素会看到来自多个投影仪位置的光。在双峰多路径的情况下，相机像素恰好从两个位置接收光，这种情况发生在阶跃边缘，该边缘穿过一个像素，因此该像素同时看到前景和背景表面。在本文中，我们提出了一个通用的数学模型，以解决相移或所谓的相位测量轮廓仪扫描仪中的这种双峰多路径问题，测量两条光路之间的相长和相消干涉，并利用这种干涉分离路径并进行两次解耦的深度测量。我们通过模拟和一些具有挑战性的实际场景验证了我们的算法，其性能显著优于现有方法。
