Zhou Zesen, Jia Shanshan, Cao Lei
State Key Laboratory of Advanced Electromagnetic Engineering and Technology, Huazhong University of Science and Technology, Wuhan 430074, China.
Sensors (Basel). 2022 Oct 17;22(20):7877. doi: 10.3390/s22207877.
The complex refractive index for low-loss materials is conventionally extracted by either approximate analytical formula or numerical iterative algorithm (such as Nelder-Mead and Newton-Raphson) based on the transmission-mode terahertz time domain spectroscopy (THz-TDS). A novel 4-layer neural network model is proposed to obtain optical parameters of low-loss materials with high accuracy in a wide range of parameters (frequency and thickness). Three materials (TPX, z-cut crystal quartz and 6H SiC) with different dispersions and thicknesses are used to validate the robustness of the general model. Without problems of proper initial values and non-convergence, the neural network method shows even smaller errors than the iterative algorithm. Once trained and tested, the proposed method owns both high accuracy and wide generality, which will find application in the multi-class object detection and high-precision characterization of THz materials.
传统上,基于透射模式太赫兹时域光谱(THz-TDS),通过近似解析公式或数值迭代算法(如Nelder-Mead算法和牛顿-拉弗森算法)来提取低损耗材料的复折射率。本文提出了一种新颖的4层神经网络模型,用于在宽参数范围(频率和厚度)内高精度地获取低损耗材料的光学参数。使用三种具有不同色散和厚度的材料(TPX、z切割晶体石英和6H碳化硅)来验证通用模型的稳健性。神经网络方法不存在合适初始值和不收敛的问题,其误差甚至比迭代算法更小。一旦经过训练和测试,该方法具有高精度和广泛的通用性,将在太赫兹材料的多类目标检测和高精度表征中得到应用。