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用于评估硅橡胶绝缘子老化状态的便携式无损磁共振传感器。

Portable Non-Destructive Magnetic Resonance Sensor for Assessing the Aging Status of Silicon Rubber Insulators.

作者信息

Guo Pan, Wang Liling, Wang Rui, Li Bing, Zhao Zhirui

机构信息

College of Physics and Electronic Engineering, Chongqing Normal University, Chongqing 401331, China.

Urumqi Power Supply Company, State Grid Xinjiang Electric Power Co., Ltd., Urumqi 830063, China.

出版信息

Nanomaterials (Basel). 2022 Oct 31;12(21):3847. doi: 10.3390/nano12213847.

DOI:10.3390/nano12213847
PMID:36364623
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC9656415/
Abstract

Silicone rubber insulators (SRIs) are widely used in high-voltage power grids. Due to high-voltage fields and harsh environmental conditions, SRIs eventually deteriorate with use in the power grid, decreasing their insulating performance and operational life and contributing to transmission line failures. Therefore, quantitatively assessing the aging status of SRIs is crucial. In this study, we evaluated the viability of the magnetic resonance method for assessing the age of SRIs at the level of chemical structure; we built and made a portable magnetic resonance sensor, and evaluated the sensor's functionality. By measuring the SRI sheds at various service times, it was discovered that the equivalent transverse relaxation time, , can describe the degree of aging of the SRIs. The results of the magnetic resonance measurements were also compared with those of the static contact angle method, and the two measurement methods yielded the same conclusions. However, the magnetic resonance method was more sensitive than the one using the static contact angle method.

摘要

硅橡胶绝缘子(SRIs)广泛应用于高压电网。由于高压电场和恶劣的环境条件,SRIs在电网中使用时最终会劣化,降低其绝缘性能和使用寿命,并导致输电线路故障。因此,定量评估SRIs的老化状态至关重要。在本研究中,我们评估了磁共振方法在化学结构层面评估SRIs老化程度的可行性;我们构建并制作了一个便携式磁共振传感器,并评估了该传感器的功能。通过测量不同服役时间的SRIs伞裙,发现等效横向弛豫时间可以描述SRIs的老化程度。还将磁共振测量结果与静态接触角法的结果进行了比较,两种测量方法得出了相同的结论。然而,磁共振方法比使用静态接触角的方法更灵敏。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/394579245644/nanomaterials-12-03847-g015.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/048c53fb507c/nanomaterials-12-03847-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/633826db54d5/nanomaterials-12-03847-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/5e8c5a291437/nanomaterials-12-03847-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/128c0935484b/nanomaterials-12-03847-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/409f88193f71/nanomaterials-12-03847-g013.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/288edc2e5602/nanomaterials-12-03847-g002.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/e975a420d73c/nanomaterials-12-03847-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/202c9a4a0b06/nanomaterials-12-03847-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/a964dacf3f84/nanomaterials-12-03847-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/abf588f0719c/nanomaterials-12-03847-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/4a7307add406/nanomaterials-12-03847-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/048c53fb507c/nanomaterials-12-03847-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/633826db54d5/nanomaterials-12-03847-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/5e8c5a291437/nanomaterials-12-03847-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/128c0935484b/nanomaterials-12-03847-g012.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/409f88193f71/nanomaterials-12-03847-g013.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/96fe82eff9ea/nanomaterials-12-03847-g014.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6504/9656415/394579245644/nanomaterials-12-03847-g015.jpg

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Review of Aging Evaluation Methods for Silicone Rubber Composite Insulators.硅橡胶复合绝缘子老化评估方法综述
Polymers (Basel). 2023 Feb 24;15(5):1141. doi: 10.3390/polym15051141.

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