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用于微波成像的梯度折射率超表面透镜。

Gradient Index Metasurface Lens for Microwave Imaging.

作者信息

Datta Srijan, Tamburrino Antonello, Udpa Lalita

机构信息

Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI 48824, USA.

Department of Electrical and Information Engineering, Università degli Studi di Cassino e del Lazio Meridionale, 03043 Cassino, Italy.

出版信息

Sensors (Basel). 2022 Oct 30;22(21):8319. doi: 10.3390/s22218319.

Abstract

This paper presents the design, simulation and experimental validation of a gradient-index (GRIN) metasurface lens operating at 8 GHz for microwave imaging applications. The unit cell of the metasurface consists of an electric-LC (ELC) resonator. The effective refractive index of the metasurface is controlled by varying the capacitive gap at the center of the unit cell. This allows the design of a gradient index surface. A one-dimensional gradient index lens is designed and tested at first to describe the operational principle of such lenses. The design methodology is extended to a 2D gradient index lens for its potential application as a microwave imaging device. The metasurface lenses are designed and analyzed using full-wave finite element (FEM) solver. The proposed 2D lens has an aperture of size 119 mm (3.17λ) × 119 mm (3.17λ) and thickness of only 0.6 mm (0.016λ). Horn antenna is used as source of plane waves incident on the lens to evaluate the focusing performance. Field distributions of the theoretical designs and fabricated lenses are analyzed and are shown to be in good agreement. A microwave nondestructive evaluation (NDE) experiment is performed with the 2D prototype lens to image a machined groove in a Teflon sample placed at the focal plane of the lens.

摘要

本文介绍了一种用于微波成像应用的、工作在8 GHz的梯度折射率(GRIN)超表面透镜的设计、仿真和实验验证。超表面的单元结构由一个电-LC(ELC)谐振器组成。通过改变单元结构中心处的电容间隙来控制超表面的有效折射率。这使得能够设计出一种梯度折射率表面。首先设计并测试了一维梯度折射率透镜,以描述此类透镜的工作原理。由于其作为微波成像设备的潜在应用,将设计方法扩展到二维梯度折射率透镜。使用全波有限元(FEM)求解器对超表面透镜进行设计和分析。所提出的二维透镜孔径尺寸为119 mm(3.17λ)×119 mm(3.17λ),厚度仅为0.6 mm(0.016λ)。使用喇叭天线作为入射到透镜上的平面波源来评估聚焦性能。对理论设计和制造的透镜的场分布进行了分析,结果显示两者吻合良好。使用二维原型透镜进行了微波无损评估(NDE)实验,以对放置在透镜焦平面处的聚四氟乙烯样品中的加工凹槽进行成像。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f600/9654608/97e5d9bd8755/sensors-22-08319-g001.jpg

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