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通过低能电子衍射(LEED)和密度泛函理论(DFT)观察到的Ru(0001)上二氧化硅双层膜的结构与注册表

Structure and registry of the silica bilayer film on Ru(0001) as viewed by LEED and DFT.

作者信息

Soares Edmar A, Paier Joachim, Gura Leonard, Burson Kristen, Ryczek Catherine, Yang Zechao, Stavale Fernando, Heyde Markus, Freund Hans-Joachim

机构信息

Department of Physics, Federal University of Minas Gerais, Brazil.

Fritz-Haber-Institute of the Max-Planck Society, Faradayweg 4-6, 14195 Berlin, Germany.

出版信息

Phys Chem Chem Phys. 2022 Dec 14;24(48):29721-29730. doi: 10.1039/d2cp04624e.

Abstract

Silica bilayers are stable on various metal substrates, including Ru(0001) that is used for the present study. In a systematic attempt to elucidate the detailed structure of the silica bilayer film and its registry to the metal substrate, we performed a low energy electron diffraction (I/V-LEED) study. The experimental work is accompanied by detailed calculations on the stability, orientation and dynamic properties of the bilayer at room temperature. It was determined, that the film shows a certain structural diversity within the unit cell of the metal substrate, which depends on the oxygen content at the metal-bilayer interface. In connection with the experimental I/V-LEED study, it became apparent, that a high-quality structure determination is only possible if several structural motifs are taken into account by superimposing bilayer structures with varying registry to the oxygen covered substrate. This result is conceptually in line with the recently observed statistical registry in layered 2D-compound materials.

摘要

二氧化硅双层在各种金属衬底上是稳定的,包括本研究中使用的Ru(0001)。为了系统地阐明二氧化硅双层膜的详细结构及其与金属衬底的配准关系,我们进行了低能电子衍射(I/V-LEED)研究。实验工作伴随着对双层在室温下的稳定性、取向和动力学性质的详细计算。结果表明,该薄膜在金属衬底的晶胞内呈现出一定的结构多样性,这取决于金属-双层界面处的氧含量。结合实验性的I/V-LEED研究,很明显,只有通过叠加与氧覆盖衬底具有不同配准关系的双层结构,考虑多个结构基序,才能进行高质量的结构测定。这一结果在概念上与最近在层状二维复合材料中观察到的统计配准一致。

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