Single-pixel imaging using discrete Zernike moments.

A novel single-pixel imaging (SPI) technique based on discrete orthogonal Zernike moments is proposed. In this technique, the target object is illuminated by two sets of Zernike basis patterns which satisfy the Zernike polynomials. The Zernike moments of object image are obtained by measuring the reflected light intensities through a single-pixel detector. And the object image is reconstructed by summing the product of Zernike polynomials and detected intensities iteratively. By theoretical and experimental demonstrations, an image with high quality is retrieved under compressive sampling. Moreover, the Zernike illuminating patterns are used for object classification due to the rotation invariant of Zernike moments. By measuring the amplitudes of a few specific Zernike moments through the SPI system, the rotated images with different angles and the same content are classified into the same class on experiment. This classification technique has the advantages of high efficiency and high accuracy due to the high modulation speed and high sensitivity of SPI system.