Department of Energy Science and Engineering, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India.
Rev Sci Instrum. 2022 Dec 1;93(12):123514. doi: 10.1063/5.0124816.
This paper presents a joint calibration scheme for voltage (V) and current (I) probes that helps accurately resolve the voltage-current phase differences even when the difference is very close to 90°. The latter has been a major issue with V-I probes when used with miniature RF plasma devices such as the atmospheric pressure plasma jet (APPJ). Since the impedance of such miniature devices is predominantly capacitive, the phase difference between the voltage and current signals is very nearly 90°. It turns out, however, that when V-I probes are used with such devices without joint calibration, these frequently yield phase shifts over 90°. Also, since the power absorption is proportional to the resistive part of the impedance, it becomes very sensitive to the phase difference when it is close to ≈90°. Thus, it is important to be able to accurately resolve the phases. Post-calibration, V-I probes would be indispensable for the electrical characterization of APPJs for determining the average RF power P, plasma impedance Z, etc. Typical post-calibration V-I data yield Z ≈ 93.6 - j 1139 Ω (81.5 - j 1173 Ω) at P ≈9.8W (≈7.7W) for helium (argon) gas.
本文提出了一种电压(V)和电流(I)探头的联合校准方案,有助于准确解决电压-电流相位差问题,即使相位差非常接近 90°。当使用微型射频等离子体设备(如大气压等离子体射流(APPJ))时,这一直是 V-I 探头的一个主要问题。由于这种微型设备的阻抗主要是电容性的,因此电压和电流信号之间的相位差非常接近 90°。然而,事实证明,当没有联合校准就使用 V-I 探头时,这些探头通常会产生超过 90°的相移。此外,由于功率吸收与阻抗的电阻部分成正比,因此当它接近≈90°时,它对相位差非常敏感。因此,能够准确地解决相位问题非常重要。校准后,V-I 探头对于 APPJ 的电气特性表征是必不可少的,可用于确定平均射频功率 P、等离子体阻抗 Z 等。典型的校准后 V-I 数据在 P ≈9.8W(≈7.7W)时,氦(氩)气的 Z ≈ 93.6 - j 1139 Ω(81.5 - j 1173 Ω)。