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界面相互作用使具有高 k 值氟化聚合物介电质的杂化钙钛矿-共轭聚合物晶体管具有增强的迁移率。

Interfacial Interaction Enables Enhanced Mobility in Hybrid Perovskite-Conjugated Polymer Transistors with High-k Fluorinated Polymer Dielectrics.

机构信息

Department of Energy and Materials Engineering and Research Center for Photoenergy Harvesting & Conversion Technology (phct), Dongguk University, 30 Pildong-ro, 1-gil, Jung-gu, Seoul, 04620, Republic of Korea.

出版信息

Macromol Rapid Commun. 2023 Apr;44(8):e2200954. doi: 10.1002/marc.202200954. Epub 2023 Jan 31.

Abstract

The charge carrier mobility of organic field-effect transistors (OFETs) has been remarkably improved through several engineering approaches and techniques by targeting pivotal parts. Herein, an ultrathin perovskite channel layer that boosts the field-effect mobility of conjugated polymer OFETs by forming perovskite-conjugated polymer hybrid semiconducting channel is introduced. The optimized lead-iodide-based perovskite-conjugated polymer hybrid channel transistors show enhanced hole mobility of over 4 cm  V  s (average = 2.10 cm  V  s ) with high reproducibility using a benchmark poly(3-hexylthiophene) (P3HT) polymer and employing high-k fluorinated polymer dielectrics. A significant hole carrier mobility enhancement of ≈200-400% in benzo[1,2-b:4,5:b']dithiophene (BDT)-based conjugated polymers is also demonstrated by exploring certain interactive groups with perovskite. This significant enhancement in the transistor performance is attributed to the increased charge carrier density in the hybrid semiconducting channel and the perovskite-polymer interactions. The findings of this paper demonstrate an exceptional engineering approach for carrier mobility enhancement in hybrid perovskite-conjugated-polymer-based electronic devices.

摘要

通过针对关键部分的几种工程方法和技术,有机场效应晶体管(OFET)的电荷载流子迁移率得到了显著提高。本文介绍了一种超薄钙钛矿沟道层,通过形成钙钛矿-共轭聚合物混合半导体沟道,提高了共轭聚合物 OFET 的场效应迁移率。优化后的基于铅碘的钙钛矿-共轭聚合物混合沟道晶体管在使用基准聚(3-己基噻吩)(P3HT)聚合物和高介电常数氟聚合物介电材料时,表现出超过 4 cm ² V ¹ s(平均值=2.10 cm ² V ¹ s)的增强空穴迁移率,具有较高的重现性。通过探索与钙钛矿具有某些相互作用的基团,基于苯并[1,2-b:4,5-b']二噻吩(BDT)的共轭聚合物的空穴载流子迁移率也提高了约 200-400%。晶体管性能的这种显著增强归因于混合半导体沟道中的电荷载流子密度增加和钙钛矿-聚合物相互作用。本文的研究结果表明,在混合钙钛矿-共轭聚合物电子器件中,提高载流子迁移率的方法非常出色。

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