高分辨率 X 射线能谱仪用于 X 射线吸收精细结构光谱学。
High-resolution x-ray spectrometer for x-ray absorption fine structure spectroscopy.
机构信息
Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627, USA.
Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623-1299, USA.
出版信息
Rev Sci Instrum. 2023 Jan 1;94(1):013101. doi: 10.1063/5.0125712.
Two extended x-ray absorption fine structure flat crystal x-ray spectrometers (EFX's) were designed and built for high-resolution x-ray spectroscopy over a large energy range with flexible, on-shot energy dispersion calibration capabilities. The EFX uses a flat silicon [111] crystal in the reflection geometry as the energy dispersive optic covering the energy range of 6.3-11.4 keV and achieving a spectral resolution of 4.5 eV with a source size of 50 μm at 7.2 keV. A shot-to-shot configurable calibration filter pack and Bayesian inference routine were used to constrain the energy dispersion relation to within ±3 eV. The EFX was primarily designed for x-ray absorption fine structure (XAFS) spectroscopy and provides significant improvement to the Laboratory for Laser Energetics' OMEGA-60 XAFS experimental platform. The EFX is capable of performing extended XAFS measurements of multiple absorption edges simultaneously on metal alloys and x-ray absorption near-edge spectroscopy to measure the electron structure of compressed 3d transition metals.
两个扩展的 X 射线吸收精细结构平面晶体 X 射线能谱仪（EFX）被设计并制造出来，用于在大能量范围内进行高分辨率 X 射线光谱学研究，具有灵活的、随机关联的能量色散校准能力。EFX 采用反射几何中的平面硅[111]晶体作为能量色散光学器件，覆盖了 6.3-11.4keV 的能量范围，在 7.2keV 时实现了 4.5eV 的光谱分辨率，源尺寸为 50μm。通过使用可随机关联的配置校准滤波器组和贝叶斯推断例程，可以将能量色散关系约束在±3eV 以内。EFX 主要用于 X 射线吸收精细结构（XAFS）光谱学，为实验室激光能量学的 OMEGA-60 XAFS 实验平台提供了重要改进。EFX 能够同时对金属合金进行多个吸收边的扩展 XAFS 测量，并进行 X 射线吸收近边光谱学测量，以测量压缩 3d 过渡金属的电子结构。
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