Novel Approach for Quantitative Characterization of Short-Range Molecular Order in Gelatinized Starch by X-ray Diffraction.

A novel quantitative method was developed to characterize short-range molecular order in gelatinized wheat and potato starches using X-ray diffraction (XRD). Gelatinized starches with different amounts of short-range molecular order and amorphous starches with no short-range molecular order were prepared and characterized by the intensity and area of Raman spectral bands. The degree of short-range molecular order in the gelatinized wheat and potato starches decreased with increasing water content used for gelatinization. By comparing XRD patterns of gelatinized and amorphous starch, the XRD peak at 33° (2θ) was shown to be typical of gelatinized starch. The relative peak area (RPA), intensity, and full width at half-maximum (FWHM) of the XRD peak at 33° (2θ) decreased with the increase in water content for gelatinization. We propose that the RPA of the XRD peak at 33° (2θ) can be used to quantify the amount of short-range molecular order in gelatinized starch. The method developed in this study will help to explore and understand the relationship between the structure and functionality of gelatinized starch in food and nonfood applications.