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掺镨硅酸镁锶的短波紫外持续发光

Shortwave Ultraviolet Persistent Luminescence of SrMgSiO: Pr.

作者信息

Antuzevics Andris, Doke Guna, Krieke Guna, Rodionovs Pavels, Nilova Dace, Cirulis Jekabs, Fedotovs Andris, Rogulis Uldis

机构信息

Institute of Solid State Physics, University of Latvia, 8 Kengaraga str., LV-1063 Riga, Latvia.

出版信息

Materials (Basel). 2023 Feb 21;16(5):1776. doi: 10.3390/ma16051776.

Abstract

Currently, extensive research activities are devoted to developing persistent phosphors which extend beyond the visible range. In some emerging applications, long-lasting emission of high-energy photons is required; however, suitable materials for the shortwave ultraviolet (UV-C) band are extremely limited. This study reports a novel SrMgSiO phosphor doped with Pr ions, which exhibits UV-C persistent luminescence with maximum intensity at 243 nm. The solubility of Pr in the matrix is analysed by X-ray diffraction (XRD) and optimal activator concentration is determined. Optical and structural properties are characterised by photoluminescence (PL), thermally stimulated luminescence (TSL) and electron paramagnetic resonance (EPR) spectroscopy techniques. The obtained results expand the class of UV-C persistent phosphors and provide novel insights into the mechanisms of persistent luminescence.

摘要

目前,广泛的研究活动致力于开发超出可见光范围的长余辉荧光粉。在一些新兴应用中,需要高能光子的持久发射;然而,适用于短波紫外(UV-C)波段的材料极其有限。本研究报道了一种掺杂Pr离子的新型SrMgSiO荧光粉,其在243nm处呈现出UV-C持久发光且强度最大。通过X射线衍射(XRD)分析了Pr在基质中的溶解度,并确定了最佳激活剂浓度。利用光致发光(PL)、热释光(TSL)和电子顺磁共振(EPR)光谱技术对光学和结构性质进行了表征。所得结果扩展了UV-C持久荧光粉的类别,并为持久发光机制提供了新的见解。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d91c/10003772/bd7123485b07/materials-16-01776-g001.jpg

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