• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

通过进动路径分割校正探头漂移。

Correcting for probe wandering by precession path segmentation.

作者信息

Nordahl Gregory, Jones Lewys, Christiansen Emil Frang, Hunnestad Kasper Aas, Nord Magnus

机构信息

Department of Physics, Norwegian University of Science and Technology (NTNU), 7491 Trondheim, Norway.

School of Physics, Trinity College Dublin, Dublin 2, Ireland; Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Dublin 2, Ireland.

出版信息

Ultramicroscopy. 2023 Jun;248:113715. doi: 10.1016/j.ultramic.2023.113715. Epub 2023 Mar 8.

DOI:10.1016/j.ultramic.2023.113715
PMID:36924599
Abstract

Precession electron diffraction has in the past few decades become a powerful technique for structure solving, strain analysis, and orientation mapping, to name a few. One of the benefits of precessing the electron beam, is increased reciprocal space resolution, albeit at a loss of spatial resolution due to an effect referred to as 'probe wandering'. Here, a new methodology of precession path segmentation is presented to counteract this effect and increase the resolution in reconstructed virtual images from scanning precession electron diffraction data. By utilizing fast pixelated electron detector technology, multiple frames are recorded for each azimuthal rotation of the beam, allowing for the probe wandering to be corrected in post-acquisition processing. Not only is there an apparent increase in the resolution of the reconstructed images, but probe wandering due to instrument misalignment is reduced, potentially easing an already difficult alignment procedure.

摘要

在过去几十年中,进动电子衍射已成为一种强大的技术,可用于结构解析、应变分析和取向映射等。使电子束进动的一个好处是增加了倒易空间分辨率,尽管由于所谓的“探针漂移”效应会损失空间分辨率。在此,提出了一种新的进动路径分割方法,以抵消这种效应并提高从扫描进动电子衍射数据重建的虚拟图像的分辨率。通过利用快速像素化电子探测器技术,在电子束每次方位角旋转时记录多帧,从而允许在采集后处理中校正探针漂移。不仅重建图像的分辨率明显提高,而且由于仪器未对准导致的探针漂移也减少了,这可能会简化本就困难的对准程序。

相似文献

1
Correcting for probe wandering by precession path segmentation.通过进动路径分割校正探头漂移。
Ultramicroscopy. 2023 Jun;248:113715. doi: 10.1016/j.ultramic.2023.113715. Epub 2023 Mar 8.
2
High-resolution scanning precession electron diffraction: Alignment and spatial resolution.高分辨率扫描进动电子衍射:对准与空间分辨率
Ultramicroscopy. 2017 Mar;174:79-88. doi: 10.1016/j.ultramic.2016.12.018. Epub 2016 Dec 25.
3
Nanocrystal segmentation in scanning precession electron diffraction data.扫描进动电子衍射数据中的纳米晶体分割
J Microsc. 2020 Sep;279(3):158-167. doi: 10.1111/jmi.12850. Epub 2019 Dec 9.
4
Quasi-parallel precession diffraction: Alignment method for scanning transmission electron microscopes.准平行进动衍射:扫描透射电子显微镜的对准方法
Ultramicroscopy. 2018 Oct;193:39-51. doi: 10.1016/j.ultramic.2018.06.005. Epub 2018 Jun 6.
5
On the alignment for precession electron diffraction.进动电子衍射线的准直。
Ultramicroscopy. 2012 Jun;117:1-6. doi: 10.1016/j.ultramic.2012.03.021. Epub 2012 Apr 7.
6
Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post-Acquisition Data Processing, Visualization, and Structural Characterization.扫描透射电子显微镜中的快速像素化探测器。第二部分:采集后的数据处理、可视化和结构表征。
Microsc Microanal. 2020 Oct;26(5):944-963. doi: 10.1017/S1431927620024307.
7
Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results.利用进动辅助衍射斑点识别实现透射电子显微镜中的取向和相位映射:最新研究成果。
J Microsc. 2013 Oct;252(1):23-34. doi: 10.1111/jmi.12065. Epub 2013 Jul 24.
8
Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys.用于铝合金中析出相相图绘制的扫描进动电子衍射数据分析方法。
Ultramicroscopy. 2024 Jan;255:113861. doi: 10.1016/j.ultramic.2023.113861. Epub 2023 Oct 6.
9
A Comparison of a Direct Electron Detector and a High-Speed Video Camera for a Scanning Precession Electron Diffraction Phase and Orientation Mapping.用于扫描进动电子衍射相和取向映射的直接电子探测器与高速摄像机的比较
Microsc Microanal. 2020 Dec;26(6):1110-1116. doi: 10.1017/S1431927620024411.
10
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: experimental demonstration at atomic resolution.使用像素化探测器在扫描透射电子显微镜中实现高效相衬成像。第1部分:原子分辨率下的实验演示。
Ultramicroscopy. 2015 Apr;151:160-167. doi: 10.1016/j.ultramic.2014.09.013. Epub 2014 Oct 15.