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通过X射线断层扫描对药物片剂进行表征。

Characterization of Pharmaceutical Tablets by X-ray Tomography.

作者信息

Vijayakumar Jaianth, Goudarzi Niloofar Moazami, Eeckhaut Guy, Schrijnemakers Koen, Cnudde Veerle, Boone Matthieu N

机构信息

Centre for X-ray Tomography (UGCT), Ghent University, Proeftuinstraat 86/N3, 9000 Gent, Belgium.

Department of Physics and Astronomy, Radiation Physics, Ghent University, Proeftuinstraat 86/N12, 9000 Gent, Belgium.

出版信息

Pharmaceuticals (Basel). 2023 May 11;16(5):733. doi: 10.3390/ph16050733.

Abstract

Solid dosage forms such as tablets are extensively used in drug administration for their simplicity and large-scale manufacturing capabilities. High-resolution X-ray tomography is one of the most valuable non-destructive techniques to investigate the internal structure of the tablets for drug product development as well as for a cost effective production process. In this work, we review the recent developments in high-resolution X-ray microtomography and its application towards different tablet characterizations. The increased availability of powerful laboratory instrumentation, as well as the advent of high brilliance and coherent 3rd generation synchrotron light sources, combined with advanced data processing techniques, are driving the application of X-ray microtomography forward as an indispensable tool in the pharmaceutical industry.

摘要

片剂等固体剂型因其简单性和大规模生产能力而在药物给药中被广泛使用。高分辨率X射线断层扫描是研究片剂内部结构以用于药品开发以及经济高效生产过程的最有价值的无损技术之一。在这项工作中,我们回顾了高分辨率X射线显微断层扫描的最新进展及其在不同片剂表征方面的应用。强大的实验室仪器的可用性增加,以及高亮度和相干第三代同步辐射光源的出现,再加上先进的数据处理技术,正在推动X射线显微断层扫描作为制药行业不可或缺的工具向前发展。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/43bd/10224568/6ad639029c17/pharmaceuticals-16-00733-g001.jpg

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