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利用荧光共振能量转移成像技术检测二级结构形成

Detecting secondary structure formation with FRET-PAINT.

作者信息

Kodikara Sineth G, Merkel Kylie J, Haas Simon J, Shiekh Sajad, Balci Hamza

机构信息

Department of Physics, Kent State University, Kent, OH, 44242, USA.

出版信息

Analyst. 2023 Sep 25;148(19):4655-4658. doi: 10.1039/d3an01118f.

Abstract

We present single molecule studies demonstrating the capabilities of the FRET-PAINT method to detect secondary structures that would be challenging to detect with alternative methods, particularly single molecule FRET (smFRET). Instead of relying on the change in end-to-end separation as in smFRET, we use the change in accessibility to a small probe as the criterion for secondary structure formation and relative stability. As a model system, we study G-triplex formation by human telomeric repeat sequences in different structural contexts.

摘要

我们展示了单分子研究,证明了荧光共振能量转移-点杂交(FRET-PAINT)方法检测二级结构的能力,而这些二级结构用其他方法(特别是单分子荧光共振能量转移(smFRET))检测具有挑战性。与smFRET中依赖于端到端分离的变化不同,我们使用小探针可及性的变化作为二级结构形成和相对稳定性的标准。作为一个模型系统,我们研究了人类端粒重复序列在不同结构背景下形成G-三链体的情况。

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