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采用亚秒级原位同步加速器 X 射线微断层摄影术研究组合微波-对流烤箱中面包烘烤过程中的结构形成。

Structural formation during bread baking in a combined microwave-convective oven determined by sub-second in-situ synchrotron X-ray microtomography.

机构信息

Division of Solid Mechanics, Faculty of Engineering, Lund University, Lund, Sweden.

Department of Agriculture and Food, Research Institutes of Sweden (RISE), 402 29 Göteborg, Sweden.

出版信息

Food Res Int. 2023 Nov;173(Pt 1):113283. doi: 10.1016/j.foodres.2023.113283. Epub 2023 Jul 17.

DOI:10.1016/j.foodres.2023.113283
PMID:37803595
Abstract

A new concept has been developed for characterizing the real-time evolution of the three-dimensional pore and lamella microstructure of bread during baking using synchrotron X-ray microtomography (SRµCT). A commercial, combined microwave-convective oven was modified and installed at the TOMCAT synchrotron tomography beamline at the Swiss Light Source (SLS), to capture the 3D dough-to-bread structural development in-situ at the micrometer scale with an acquisition time of 400 ms. This allowed characterization and quantitative comparison of three baking technologies: (1) convective heating, (2) microwave heating, and (3) a combination of convective and microwave heating. A workflow for automatic batchwise image processing and analysis of 3D bread structures (1530 analyzed volumes in total) was established for porosity, individual pore volume, elongation, coordination number and local wall thickness, which allowed for evaluation of the impact of baking technology on the bread structure evolution. The results showed that the porosity, mean pore volume and mean coordination number increase with time and that the mean local cell wall thickness decreases with time. Small and more isolated pores are connecting with larger and already more connected pores as function of time. Clear dependencies are established during the whole baking process between the mean pore volume and porosity, and between the mean local wall thickness and the mean coordination number. This technique opens new opportunities for understanding the mechanisms governing the structural changes during baking and discern the parameters controlling the final bread quality.

摘要

利用同步加速器 X 射线微断层扫描(SRµCT),开发了一种新的概念来描述面包在烘焙过程中三维孔隙和薄片微观结构的实时演变。对一台商业的组合式微波对流烤箱进行了改进,并将其安装在瑞士光源(SLS)的 TOMCAT 同步断层扫描光束线上,以便在微尺度下以 400ms 的采集时间原位捕获三维面团到面包的结构发展。这允许对三种烘焙技术进行特征描述和定量比较:(1)对流加热,(2)微波加热,和(3)对流和微波加热的组合。建立了用于 3D 面包结构(总共分析了 1530 个体积)的自动批量图像处理和分析的工作流程,用于分析孔隙率、单个孔隙体积、伸长率、配位数和局部壁厚,这允许评估烘焙技术对面包结构演变的影响。结果表明,孔隙率、平均孔隙体积和平均配位数随时间增加,平均局部细胞壁厚度随时间减小。较小且更孤立的孔隙随着时间的推移与较大且已经更连通的孔隙相连。在整个烘焙过程中,平均孔隙体积和孔隙率之间,以及平均局部壁厚度和平均配位数之间都建立了明确的相关性。这项技术为理解烘焙过程中结构变化的机制以及辨别控制最终面包质量的参数提供了新的机会。

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