A practical stress-based test method for evaluating reversible stress limit for critical current degradation in rare-earth barium copper oxide (REBCO) tapes.

The superior electromechanical properties of second-generation high-temperature superconducting rare-earth barium copper oxide (REBCO) coated conductor tapes make them viable candidates for high magnetic field applications. To characterize their electromechanical properties (EMPs) under operating conditions, the critical current degradation behavior of the REBCO tapes should be evaluated. Conventional evaluation methods for EMPs usually rely on a strain-based test method that utilizes an extensometer to measure the deformation induced on the coated conductor tape. This study aims to establish a practical stress-based test method that determines the reversible stress limit for critical current (Ic) degradation in REBCO tapes without using extensometers under uniaxial tension. For an efficient test procedure, Ic measurements were initially performed with broad stress intervals and then changed to narrow stress intervals before the critical current degraded irreversibly. Four commercially available REBCO tape samples were used to validate the reliability of the proposed stress-based test method. It was then assessed by comparing them with those obtained using the conventional strain-based test method. Statistical estimations were used to determine the reproducibility of the results. These results provide a basis for an international round-robin test guideline to establish a test method for measuring the electromechanical properties of high-temperature superconducting tapes at cryogenic temperatures.