Guo Chen, Miranda Miguel, Raab Ann-Kathrin, Viotti Anne-Lise, Tiago Guerreiro Paulo, Romero Rosa, Crespo Helder, L'Huillier Anne, Arnold Cord L
Opt Lett. 2023 Oct 15;48(20):5431-5434. doi: 10.1364/OL.498664.
We propose a single-shot, high-repetition rate measurement scheme of the carrier-envelope phase offset of ultrashort laser pulses. The spectral fringes resulting from f-2f nonlinear interferometry, encoding the carrier-envelope-phase, are evaluated completely optically via an optical Fourier transform. For demonstration, the carrier-envelope-phase of a 200 kHz, few-cycle optical parametric chirped-pulse amplification (OPCPA) laser system was measured employing an interferometer as a periodic optical filter. The proposed method shows excellent agreement with simultaneous measurement of the spectral fringes by a fast line-scan camera.
我们提出了一种用于测量超短激光脉冲载波包络相位偏移的单次、高重复率测量方案。由f-2f非线性干涉测量产生的、编码载波包络相位的光谱条纹，通过光学傅里叶变换完全以光学方式进行评估。为作演示，使用干涉仪作为周期性光学滤波器，测量了一个200 kHz、少周期光参量啁啾脉冲放大（OPCPA）激光系统的载波包络相位。所提出的方法与使用快速线扫描相机对光谱条纹进行同步测量的结果显示出极佳的一致性。
