[50赫兹电磁场对大鼠工作记忆的影响及神经机制研究]

[Effects of 50 Hz electromagnetic field on rat working memory and investigation of neural mechanisms].

作者信息

Wang Longlong, Li Shuangyan, Li Tianxiang, Zheng Weiran, Li Yang, Xu Guizhi

机构信息

State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin 300130, P. R. China.

Key Laboratory of Bioelectromagnetics and Neuroengineering of Hebei Province, Hebei University of Technology, Tianjin 300130, P. R. China.

出版信息

Sheng Wu Yi Xue Gong Cheng Xue Za Zhi. 2023 Dec 25;40(6):1135-1141. doi: 10.7507/1001-5515.202303032.

Abstract

With the widespread use of electrical equipment, cognitive functions such as working memory (WM) could be severely affected when people are exposed to 50 Hz electromagnetic fields (EMF) for long term. However, the effects of EMF exposure on WM and its neural mechanism remain unclear. In the present paper, 15 rats were randomly assigned to three groups, and exposed to an EMF environment at 50 Hz and 2 mT for a different duration: 0 days (control group), 24 days (experimental group I), and 48 days (experimental group II). Then, their WM function was assessed by the T-maze task. Besides, their local field potential (LFP) in the media prefrontal cortex (mPFC) was recorded by the multichannel electrophysiological recording system to study the power spectral density (PSD) of θ and γ oscillations and the phase-amplitude coupling (PAC) intensity of θ-γ oscillations during the T-maze task. The results showed that the PSD of θ and γ oscillations decreased in experimental groups I and II, and the PAC intensity between θ and high-frequency γ (hγ) decreased significantly compared to the control group. The number of days needed to meet the task criterion was more in experimental groups I and II than that of control group. The results indicate that long-term exposure to EMF could impair WM function. The possible reason may be the impaired communication between different rhythmic oscillations caused by a decrease in θ-hγ PAC intensity. This paper demonstrates the negative effects of EMF on WM and reveals the potential neural mechanisms from the changes of PAC intensity, which provides important support for further investigation of the biological effects of EMF and its mechanisms.

摘要

随着电气设备的广泛使用,当人们长期暴露于50赫兹的电磁场(EMF)时,诸如工作记忆(WM)等认知功能可能会受到严重影响。然而,EMF暴露对WM及其神经机制的影响仍不清楚。在本文中,15只大鼠被随机分为三组,并在50赫兹和2毫特斯拉的EMF环境中暴露不同时长:0天(对照组)、24天(实验组I)和48天(实验组II)。然后,通过T迷宫任务评估它们的WM功能。此外,使用多通道电生理记录系统记录它们内侧前额叶皮质(mPFC)的局部场电位(LFP),以研究T迷宫任务期间θ和γ振荡的功率谱密度(PSD)以及θ-γ振荡的相位-振幅耦合(PAC)强度。结果表明,实验组I和II中θ和γ振荡的PSD降低,与对照组相比,θ与高频γ(hγ)之间的PAC强度显著降低。实验组I和II达到任务标准所需的天数比对照组更多。结果表明,长期暴露于EMF会损害WM功能。可能的原因可能是θ-hγ PAC强度降低导致不同节律振荡之间的通信受损。本文证明了EMF对WM的负面影响,并从PAC强度变化揭示了潜在的神经机制,为进一步研究EMF的生物学效应及其机制提供了重要支持。

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