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通过电化学预氧化控制玻碳上金属氧化物薄膜生长的成核位点

Controlling Nucleation Sites for Metal Oxide Film Growth on Glassy Carbon via Electrochemical Preoxidation.

作者信息

Leimkuhl Devon P, Donley Carrie L, Jackson Megan N

机构信息

Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, North Carolina 27599, United States.

出版信息

ACS Appl Mater Interfaces. 2024 Jan 17;16(2):2868-2876. doi: 10.1021/acsami.3c13417. Epub 2024 Jan 5.

Abstract

Coating electrode materials with metal oxide thin films can improve the performance of electrocatalysts and charge storage materials. Atomic layer deposition (ALD) enables the deposition of conformal, uniform films on a wide range of electrodes; however, an even film depends on the availability of nucleation sites directly on the electrode surface. Here, we show that the electrochemical oxidation of glassy carbon electrodes prior to the deposition of alumina thin films by ALD leads to more uniform electrochemically passivating films. Cyclic voltammetry (CV), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM) demonstrate that film uniformity increases with the increasing potential of preoxidation until 2.50 V versus Ag/AgCl, at which point the films are fully passivating and appear continuous by SEM. Further increasing the potential of preoxidation leads to uniform but less consistently passivating alumina films. These findings show that electrochemical preoxidation is a rapid and readily tunable strategy for controlling oxygenic nucleation sites and therefore the growth of thin metal oxide films on glassy carbon electrodes.

摘要

用金属氧化物薄膜包覆电极材料可以提高电催化剂和电荷存储材料的性能。原子层沉积(ALD)能够在各种电极上沉积保形、均匀的薄膜;然而,均匀的薄膜取决于电极表面直接存在的成核位点。在此,我们表明,在通过ALD沉积氧化铝薄膜之前,对玻碳电极进行电化学氧化会导致形成更均匀的电化学钝化膜。循环伏安法(CV)、X射线光电子能谱(XPS)和扫描电子显微镜(SEM)表明,随着预氧化电位的增加,薄膜均匀性增加,直至相对于Ag/AgCl达到2.50 V,此时薄膜完全钝化,并且通过SEM观察显示为连续的。进一步提高预氧化电位会导致形成均匀但钝化效果不太一致的氧化铝薄膜。这些发现表明,电化学预氧化是一种快速且易于调节的策略,用于控制含氧成核位点,从而控制玻碳电极上金属氧化物薄膜的生长。

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