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二氟化氙分子俄歇衰变后的离解

Dissociation following the Auger decay of xenon difluoride molecules.

作者信息

Hikosaka Yasumasa

机构信息

Institute of Liberal Arts and Sciences, University of Toyama, Toyama 930-0194, Japan.

出版信息

J Chem Phys. 2024 Jan 14;160(2). doi: 10.1063/5.0186619.

Abstract

This study investigated the dissociation after the Xe 4d Auger decay of weak-bonding XeF2 molecules by multielectron-ion coincidence spectroscopy using a magnetic bottle electron spectrometer. Fragmentations from the XeF22+ states were clarified in the Auger spectra coincident with individual ion species. It was observed that the two-hole population led by the Auger decay was not directly inherited during the fragmentation of XeF22+. Furthermore, the dissociations of XeF23+ states produced by the double Auger decay were investigated.

摘要

本研究使用磁瓶电子谱仪,通过多电子-离子符合光谱法研究了弱键合XeF₂分子的Xe 4d俄歇衰变后的解离情况。在与单个离子种类符合的俄歇光谱中,明确了XeF₂²⁺态的碎片化情况。观察到,俄歇衰变导致的双空穴布居在XeF₂²⁺的碎片化过程中并未直接继承。此外,还研究了双俄歇衰变产生的XeF₂³⁺态的解离情况。

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