Zhang Pengju, Trester Joel, Ueda Kiyoshi, Han Meng, Balčiūnas Tadas, Wörner Hans Jakob
Laboratory for Physical Chemistry, ETH Zürich, Vladimir-Prelog-Weg 2, 8093 Zürich, Switzerland.
Department of Chemistry, Tohoku University, Sendai, 980-8578, Japan.
Phys Rev Lett. 2024 Feb 23;132(8):083201. doi: 10.1103/PhysRevLett.132.083201.
We introduce time-resolved multielectron coincidence spectroscopy and apply it to the double Auger-Meitner (AM) emission process following xenon 4d photoionization. The photoelectron and AM electron(s) are measured in coincidence by using a magnetic-bottle time-of-flight spectrometer, enabling an unambiguous assignment of the complete cascade pathways involving two AM electron emissions. In the presence of a near-infrared (NIR) laser pulse, the intermediate Xe^{2+} state embedded in the Xe^{3+} continuum is probed through single NIR photon absorption and the lifetime of this intermediate Xe^{2+} state is directly obtained as (109±22) fs.
我们引入了时间分辨多电子符合光谱技术,并将其应用于氙4d光电离后的双俄歇-迈特纳(AM)发射过程。通过使用磁瓶飞行时间光谱仪对光电子和AM电子进行符合测量,从而能够明确确定涉及两次AM电子发射的完整级联路径。在近红外(NIR)激光脉冲存在的情况下,通过单NIR光子吸收探测嵌入Xe³⁺连续谱中的中间Xe²⁺*态,并直接测得该中间Xe²⁺*态的寿命为(109±22) fs。