Suppr超能文献

交感神经突对局部钾离子浓度升高的回缩与退变

Retraction and degeneration of sympathetic neurites in response to locally elevated potassium.

作者信息

Campenot R B

出版信息

Brain Res. 1986 Dec 10;399(2):357-63. doi: 10.1016/0006-8993(86)91528-3.

Abstract

Sympathetic neurons from superior cervical ganglia of newborn rats were plated into center compartments of 3-compartment culture dishes, allowing exposure of distal neurites to media of different composition than provided to cell bodies and proximal neurites. Cultures were maintained initially with an external potassium concentration ([K+]o) of either 5 mM in all compartments or 50 mM in all compartments. After neurites had elongated into distal compartments, the culture medium was changed such that: the cell bodies and proximal neurites were exposed to 5 mM [K+]o; the distal neurites in one side compartment of each culture were also exposed to 5 mM [K+]o; but the distal neurites in the opposite side compartment were exposed to 50 mM [K+]o. During the next 7-10 days, the distal neurites locally exposed to 50 mM [K+]o degenerated. Many neurites developed a stretched appearance before degenerating, and detailed observations suggest that the neurites retracted to the point where mechanical tension exceeded their strength and then abruptly disintegrated. Neurites in opposite side compartments exposed to 5 mM [K+]o were normal in appearance and did not degenerate. These results suggest that a proximo-distal increase in [K+]o causes an extreme retraction of neurites distal to the increase. These results raise the possibility that K+ released by active nerve endings might cause the retraction of inactive nerve endings, thus providing a possible mechanism for the influence of activity on competition for synaptic sites, a pervasive phenomenon in the developing nervous system.

摘要

将新生大鼠颈上神经节的交感神经元接种到三室培养皿的中央隔室中,使远端神经突暴露于与细胞体和近端神经突所接触的培养基成分不同的培养基中。培养物最初在所有隔室中维持外部钾浓度([K⁺]ₒ)为5 mM或所有隔室中均为50 mM。当神经突延伸到远端隔室后,更换培养基,使得:细胞体和近端神经突暴露于5 mM [K⁺]ₒ;每个培养物一侧隔室中的远端神经突也暴露于5 mM [K⁺]ₒ;但另一侧隔室中的远端神经突暴露于50 mM [K⁺]ₒ。在接下来的7 - 10天里,局部暴露于50 mM [K⁺]ₒ的远端神经突发生退化。许多神经突在退化前呈现出拉伸的外观,详细观察表明,神经突回缩到机械张力超过其强度的点,然后突然崩解。暴露于5 mM [K⁺]ₒ的另一侧隔室中的神经突外观正常,没有退化。这些结果表明,[K⁺]ₒ从近端到远端的增加会导致增加部位远端的神经突极度回缩。这些结果增加了一种可能性,即活跃神经末梢释放的K⁺可能导致不活跃神经末梢的回缩,从而为活动对突触位点竞争的影响提供了一种可能的机制,这是发育中的神经系统中普遍存在的现象。

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验