Choi Seongwook, Park Sinyoung, Kim Jiwoong, Kim Hyunhee, Cho Seonghee, Kim Sunam, Park Jaeku, Kim Chulhong
Pohang University of Science and Technology (POSTECH), Medical Device Innovation Center, Department of Electrical Engineering, Convergence IT Engineering, Mechanical Engineering, Medical Science and Engineering, 77 Cheongam-ro, Pohang 37673, Republic of Korea.
Pohang Accelerator Laboratory, 77 Cheongam-ro, Pohang 37673, Republic of Korea.
Photoacoustics. 2024 Jan 13;35:100587. doi: 10.1016/j.pacs.2024.100587. eCollection 2024 Feb.
The X-ray free-electron laser (XFEL) has remarkably advanced X-ray imaging technology and enabled important scientific achievements. The XFEL's extremely high power, short pulse width, low emittance, and high coherence make possible such diverse imaging techniques as absorption/emission spectroscopy, diffraction imaging, and scattering imaging. Here, we demonstrate a novel XFEL-based imaging modality that uses the X-ray induced acoustic (XA) effect, which we call X-ray free-electron laser induced acoustic microscopy (XFELAM). Initially, we verified the XA effect by detecting XA signals from various materials, then we validated the experimental results with simulation outcomes. Next, in resolution experiments, we successfully imaged a patterned tungsten target with drilled various-sized circles at a spatial resolution of 7.8 ± 5.1 µm, which is the first micron-scale resolution achieved by XA imaging. Our results suggest that the novel XFELAM can expand the usability of XFEL in various areas of fundamental scientific research.
X射线自由电子激光（XFEL）极大地推动了X射线成像技术的发展，并取得了重要的科学成果。XFEL极高的功率、短脉冲宽度、低发射度和高相干性使得吸收/发射光谱、衍射成像和散射成像等多种成像技术成为可能。在此，我们展示了一种基于XFEL的新型成像模式，它利用了X射线诱导声学（XA）效应，我们将其称为X射线自由电子激光诱导声学显微镜（XFELAM）。首先，我们通过检测来自各种材料的XA信号验证了XA效应，然后用模拟结果验证了实验结果。接下来，在分辨率实验中，我们成功地以7.8±5.1微米的空间分辨率对带有不同尺寸钻孔圆的图案化钨靶进行了成像，这是XA成像首次实现的微米级分辨率。我们的结果表明，新型XFELAM可以扩展XFEL在基础科学研究各个领域的可用性。
