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铟和空位掺杂的6H碳化硅的电子结构与光学性质:第一性原理研究

Electronic structure and optical properties of In- and Vacancy-doped 6H-SiC: a first-principles study.

作者信息

Wang Xin, Yuan Xin, Zhou Huan, Yang Yuqing, Lu Dawei, Yang Song, Bian Ying

机构信息

School of Chemical Equipment, Shenyang University of Technology, Liaoyang, Liaoning Province, 111003, China.

School of Basic Teaching, Shenyang University of Technology, Liaoyang, Liaoning Province, 111003, China.

出版信息

J Mol Model. 2024 Mar 2;30(3):92. doi: 10.1007/s00894-024-05886-4.

Abstract

PURPOSES

The paper aims to investigative the cacuses and impacts of In- and Vacancy-doped to 6H-SiC, expecting that improving optical properties of materials. Design-Using the first-principles calculations, we discuss the electronic structure and optical properties of different doped 6H-SiC systems.

FINDINGS

The results show that In-doped 6H-SiC becomes a direct bandgap p-type semiconductor and the energy bandgap is reduced from the intrinsic 2.059 to 1.515 eV. We demonstrate the stability of the systems through the formation energy analysis, meanwhile identify their physical origins and discuss applications of all structures in electronic devices within optical analysis. Find the energy beginning values of the V-doped and V-doped systems' optical absorption spectrums and extend to 0.4 2 eV and 0.11 eV respectively compared with the original 3.23 eV. In the visible light region, the reflectivity images of the V/V and (In, V)-codoped systems rise obviously.

CONCLUSIONS

The optical properties of all doping systems were analyzed to be improved compared with the intrinsic, all above mentioned provide a theoretical basis for the fabrication of spintronic and optical devices.

摘要

目的

本文旨在研究铟(In)和空位(V)掺杂6H - 碳化硅(6H - SiC)的原因及影响,期望改善材料的光学性能。设计——采用第一性原理计算,我们讨论了不同掺杂6H - SiC系统的电子结构和光学性能。

研究结果

结果表明,In掺杂的6H - SiC成为直接带隙p型半导体,能带隙从本征的2.059 eV降低到1.515 eV。我们通过形成能分析证明了系统的稳定性,同时确定了它们的物理起源,并在光学分析中讨论了所有结构在电子器件中的应用。发现V掺杂和(In,V)共掺杂系统的光吸收光谱的能量起始值分别延伸到0.42 eV和0.11 eV,相比原始的3.23 eV。在可见光区域,V/V和(In,V)共掺杂系统的反射率图像明显上升。

结论

与本征相比,所有掺杂系统的光学性能均得到分析改善,上述所有内容为自旋电子学和光学器件的制造提供了理论基础。

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