Mao Xu, Yu Gang, Zhao Yongmei, Wei Bo, Li Zhaofeng, Yang Fuhua, Wang Xiaodong
Appl Opt. 2024 Mar 1;63(7):1867-1874. doi: 10.1364/AO.511899.
Extreme ultraviolet (EUV) radiation plays a key role in the fields of material science, attosecond metrology, and lithography. However, the reflective optical components typically used in EUV systems contribute to their bulky size, weight, and increased costs for fabrication. In this paper, we theoretically investigate transmissive metalens designs capable of focusing the EUV light based on the Pancharatnam-Berry phase. The designed metalens is composed of nanoscale elliptical holes, which can guide and manipulate EUV light due to the higher refractive index of the vacuum holes compared to that of the surrounding material. We designed an EUV metalens with a diameter of 10 µm, which supports a focal length of 24 µm and a numerical aperture of up to 0.2. It can focus 55-nm EUV incident light to a diffraction-limited spot, and the focusing efficiency is calculated to be as high as about 7% over a broad EUV frequency range (50-65 nm). This study reveals the possibility of applying a dielectric metalens in the EUV region without a transmissive optical material.
极紫外(EUV)辐射在材料科学、阿秒计量学和光刻领域发挥着关键作用。然而,EUV系统中通常使用的反射光学元件导致其体积庞大、重量增加且制造成本上升。在本文中,我们从理论上研究了基于潘查拉特纳姆 - 贝里相位能够聚焦EUV光的透射式超构透镜设计。所设计的超构透镜由纳米级椭圆孔组成,由于真空孔的折射率高于周围材料,这些孔能够引导和操控EUV光。我们设计了一个直径为10 µm的EUV超构透镜,其焦距为24 µm,数值孔径高达0.2。它能够将55 nm的EUV入射光聚焦到衍射极限光斑,并且在较宽的EUV频率范围(50 - 65 nm)内计算得出聚焦效率高达约7%。这项研究揭示了在没有透射光学材料的情况下,在EUV区域应用介电超构透镜的可能性。