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用于电子器件应用的放电等离子烧结制备的铜掺杂氧化锌陶瓷的电学和介电行为研究

Study of Electrical and Dielectric Behaviors of Copper-Doped Zinc Oxide Ceramic Prepared by Spark Plasma Sintering for Electronic Device Applications.

作者信息

Benamara Majdi, Iben Nassar Kais, Rivero-Antúnez Pedro, Essid Manel, Soreto Teixeira Silvia, Zhao Shanyu, Serrà Albert, Esquivias Luis

机构信息

Laboratory for Building Energy Materials and Components, Swiss Federal Laboratories for Materials Science and Technology (Empa), 8600 Dübendorf, Switzerland.

I3N-Aveiro, Department of Physics, University of Aveiro, 3810-193 Aveiro, Portugal.

出版信息

Nanomaterials (Basel). 2024 Feb 22;14(5):402. doi: 10.3390/nano14050402.

DOI:10.3390/nano14050402
PMID:38470733
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC10935433/
Abstract

In this study, Cu-doped ZnO aerogel nanoparticles with a 4% copper concentration (Cu4ZO) were synthesized using a sol-gel method, followed by supercritical drying and heat treatment. The subsequent fabrication of Cu4ZO ceramics through Spark Plasma Sintering (SPS) was characterized by X-ray diffraction (XRD), field-emission gun scanning electron microscopy (FE-SEM) equipped with EDS, and impedance spectroscopy (IS) across a frequency range of 100 Hz to 1 MHz and temperatures from 270 K to 370 K. The SPS-Cu4ZO sample exhibited a hexagonal wurtzite structure with an average crystallite size of approximately 229 ± 10 nm, showcasing a compact structure with discernible pores. The EDS spectrum indicates the presence of the base elements zinc and oxygen with copper like the dopant element. Remarkably, the material displayed distinct electrical properties, featuring high activation energy values of about 0.269 ± 0.021 eV. Complex impedance spectroscopy revealed the impact of temperature on electrical relaxation phenomena, with the Nyquist plot indicating semicircular arc patterns associated with grain boundaries. As temperature increased, a noticeable reduction in the radius of these arcs occurred, coupled with a shift in their center points toward the axis center, suggesting a non-Debye-type relaxation mechanism. Dielectric analyses revealed a temperature-driven evolution of losses, emphasizing the material's conductivity impact. Non-Debye-type behavior, linked to ion diffusion, sheds light on charge storage dynamics. These insights advance potential applications in electronic devices and energy storage.

摘要

在本研究中,采用溶胶 - 凝胶法合成了铜浓度为4%的铜掺杂氧化锌气凝胶纳米颗粒(Cu4ZO),随后进行超临界干燥和热处理。通过火花等离子烧结(SPS)制备Cu4ZO陶瓷,采用X射线衍射(XRD)、配备能谱仪(EDS)的场发射枪扫描电子显微镜(FE - SEM)以及在100 Hz至1 MHz频率范围和270 K至370 K温度下的阻抗谱(IS)对其进行表征。SPS - Cu4ZO样品呈现六方纤锌矿结构,平均晶粒尺寸约为229±10 nm,展示出具有可分辨孔隙的致密结构。EDS谱表明存在基础元素锌和氧以及作为掺杂元素的铜。值得注意的是,该材料表现出独特的电学性质,具有约0.269±0.021 eV的高激活能值。复阻抗谱揭示了温度对电弛豫现象的影响,奈奎斯特图表明与晶界相关的半圆弧形图案。随着温度升高,这些弧的半径明显减小,同时其中心点向轴心移动,表明存在非德拜型弛豫机制。介电分析揭示了损耗随温度的变化,强调了材料的电导率影响。与离子扩散相关的非德拜型行为揭示了电荷存储动力学。这些见解推动了在电子器件和能量存储方面的潜在应用。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/110126bea13c/nanomaterials-14-00402-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/a3bfefbc41a5/nanomaterials-14-00402-g001.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/522147574997/nanomaterials-14-00402-g008.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/8a14bbc58767/nanomaterials-14-00402-g009.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/9ffd0ffc568b/nanomaterials-14-00402-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/110126bea13c/nanomaterials-14-00402-g011.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/a3bfefbc41a5/nanomaterials-14-00402-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/f14bcfefff33/nanomaterials-14-00402-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/e23c4b8afdf9/nanomaterials-14-00402-g003.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/f63e41f512ea/nanomaterials-14-00402-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/0583de77dc68/nanomaterials-14-00402-g006.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/210670cfeb2b/nanomaterials-14-00402-g007.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/522147574997/nanomaterials-14-00402-g008.jpg
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https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/9ffd0ffc568b/nanomaterials-14-00402-g010.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/c102/10935433/110126bea13c/nanomaterials-14-00402-g011.jpg

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