Bancheva-Koleva Pavlina, Zhelev Veselin, Petkov Plamen, Petkova Tamara
Physics Department, University of Chemical Technology and Metallurgy, 8 Kliment Ohridski Blvd., 1756 Sofia, Bulgaria.
Institute of Electrochemistry and Energy Systems, Bulgarian Academy of Sciences, Akad. G. Bonchev Str. Bl. 10, 1000 Sofia, Bulgaria.
Materials (Basel). 2024 May 6;17(9):2164. doi: 10.3390/ma17092164.
A batch of ZnO thin films, pure and doped with molybdenum (up to 2 mol %), were prepared using the spray pyrolysis technique on glass and silicon substrates. The effect of molybdenum concentration on the morphology, structure and optical properties of the films was investigated. X-ray diffraction (XRD) results show a wurtzite polycrystalline crystal structure. The average crystallite size increases from 30 to 80 nm with increasing molybdenum content. Scanning electron microscopy (SEM) images demonstrate a smooth and homogeneous surface with densely spaced nanocrystalline grains. The number of nuclei increases, growing over the entire surface of the substrate with uniform grains, when the molybdenum concentration is increased to 2 mol %. The estimated root mean square (RMS) roughness values for the undoped and doped with 1 mol % and 2 mol % of ZnO thin films, defined by atomic force microscopy (AFM), are 6.12, 23.54 and 23.83 nm, respectively. The increase in Mo concentration contributes to the increase in film transmittance.
采用喷雾热解技术在玻璃和硅衬底上制备了一批纯的以及掺杂钼(掺杂量高达2摩尔%)的ZnO薄膜。研究了钼浓度对薄膜的形貌、结构和光学性能的影响。X射线衍射(XRD)结果显示为纤锌矿多晶晶体结构。随着钼含量的增加,平均晶粒尺寸从30纳米增大到80纳米。扫描电子显微镜(SEM)图像显示表面光滑且均匀,有密集排列的纳米晶粒。当钼浓度增加到2摩尔%时,核的数量增加,在整个衬底表面上生长出均匀的晶粒。通过原子力显微镜(AFM)测定,未掺杂以及掺杂1摩尔%和2摩尔%的ZnO薄膜的估计均方根(RMS)粗糙度值分别为6.12、23.54和23.83纳米。钼浓度的增加有助于提高薄膜的透过率。